Microstructural and Morphological Properties of Nanocrystalline Cu2ZnSnSe4 Thin Films: Identification New Phase on Structure

• Main Authors: Seña, N J, Dussan, A
• Format: Conference Proceeding
• Language: English
• Subjects: Copper; Copper zinc tin selenide; Crystallites; Morphology; Physics; Substrates; Thin films; X-ray diffraction
• ISSN: 1742-6588; 1742-6596
• DOI: 10.1088/1742-6596/480/1/012002

This paper presents a study of the structural and morphological properties of thin films of compound Cu2ZnSnSe4. Mass (MX) and temperature of the substrate (TS(Cu)) of compound copper (Cu), were varied. All samples were deposited by co-evaporation method in three stages. From measurements of X-ray diffraction it was possible to establish with TS increasing the presence of associated binary phases quaternary compound during the growth process of the material. It was found that the main peak around, 2θ= 27.1°, predominate binary phases Cu1.8Se and ZnSe. Measurements of X-ray diffraction were performed to pure binary compounds, showing a peak corresponding to the main peak found around the compound. Raman shifts showed associated binary compounds with the observed by XRD. In this work, we report for the first time the binary phase identification Cu1.8Se and ZnSe as part of the structure of the stannite CZTSe. Since the Scherrer equation was found that the crystallite sizes ranged between 30 and 40 nm. A correlation between structure and topography superficial is presented.