Formation of Xe2 molecules in glow gas discharge

Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spect...

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Bibliographic Details
Main Authors: E Yu Kleymenov, Klemeshev, S A, Saveliev, P A, Kryukov, N A
Format: Conference Proceeding
Language:English
Subjects:
Atomic states
Excimers
Gas discharges
Glow discharges
Infrared absorption
Physics
Pressure dependence
Rate constants
Ultraviolet emission
Xenon
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Summary:Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spectroscopy in the wavelength region 147-220 nm. Concentrations of the respective excited atomic states were estimated with infrared absorption at the Xe electronic transition wavelengths 881.9 nm and 828.0 nm. The formation rate constants kf (0+u) 4 · 10−32 cm6s−1 and kf (1u) 0.3 10−32 cm6s−1 were obtained from a pressure dependence of the atomic and molecular concentrations.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/397/1/012036