Infrared analysis of thin-film photovoltaic modules

Distinctive hot spot phenomena caused by electrical shunts in thin-film modules are analyzed by infrared thermography. Modelling the shunt current by an equivalent circuit and considering lateral heat transport, the detected phenomena are discussed. Defects show a characteristic intense temperature...

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Bibliographic Details
Published in:Journal of physics. Conference series 2010-03, Vol.214 (1), p.012089
Main Authors: Buerhop, Cl, Bachmann, J
Format: Article
Language:English
Subjects:
Circuits
Equivalent circuits
Infrared analysis
Infrared imaging
Modules
Photovoltaic cells
Physics
Thermography
Transport phenomena
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Summary:Distinctive hot spot phenomena caused by electrical shunts in thin-film modules are analyzed by infrared thermography. Modelling the shunt current by an equivalent circuit and considering lateral heat transport, the detected phenomena are discussed. Defects show a characteristic intense temperature rise (>12mK) in the center and an extended sphere of influence with reduced temperature rise.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/214/1/012089