Atomic scale graphene landscapes – natural, dosed and doped

Graphene surfaces are scrutinised for topographic peculiarities, which occur naturally or have been introduced. High-angle-annular-dark-field (HAADF) and bright-field lattice images of graphene acquired in an aberration-corrected scanning transmission electron microscope (STEM), in conjunction with...

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Bibliographic Details
Published in:Journal of physics. Conference series 2010-07, Vol.241 (1), p.012098
Main Authors: Bangert, U, Gass, M, Bleloch, A L, Nair, R R
Format: Article
Language:English
Subjects:
Boron
Electron energy
Electron energy loss spectroscopy
Fast Fourier transformations
Fourier transforms
Graphene
Image acquisition
Image transmission
Lattice vacancies
Physics
Point defects
Sheets
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Summary:Graphene surfaces are scrutinised for topographic peculiarities, which occur naturally or have been introduced. High-angle-annular-dark-field (HAADF) and bright-field lattice images of graphene acquired in an aberration-corrected scanning transmission electron microscope (STEM), in conjunction with electron energy-loss spectroscopy (EELS), show vacancy- and ad-atom-related point defects, as well as the presence of hydrogen. In boron implanted graphene, the edges of graphene sheets appear to be capture centres for boron atoms. Furthermore, rippling effects in the graphene sheets can be revealed by fast Fourier transform (FFT) procedures; these help visualise changes in the bond length projection arising from inclinations of the sheet.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/241/1/012098