Novel XAFS capabilities at ELETTRA synchrotron light source
The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample enviro...
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Published in: | Journal of physics. Conference series 2009-11, Vol.190 (1), p.012043 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions. |
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ISSN: | 1742-6596 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/190/1/012043 |