Novel XAFS capabilities at ELETTRA synchrotron light source

The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample enviro...

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Bibliographic Details
Published in:Journal of physics. Conference series 2009-11, Vol.190 (1), p.012043
Main Authors: Cicco, Andrea Di, Aquilanti, Giuliana, Minicucci, Marco, Principi, Emiliano, Novello, Nicola, Cognigni, Andrea, Olivi, Luca
Format: Article
Language:English
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Summary:The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/190/1/012043