Highly charged ion beam diagnostics at the mVINIS Ion Source

In order to determine position, dimensions and intensities of multiply charged ion beams at the mVINIS Ion Source, a novel method was developed based on a fluorescent screen and a commercial digital TV camera. The spatial characteristics of multiply charged ion beams (for example the ionization stat...

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Bibliographic Details
Published in:Journal of physics. Conference series 2007-03, Vol.58 (1), p.423-426
Main Authors: Popeskov, B, Milivojevic, M, Cvetic, J, Nedeljkovic, T, Draganic, I
Format: Article
Language:English
Subjects:
Fluorescence
Ion beams
Ion sources
Ions
Physics
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Summary:In order to determine position, dimensions and intensities of multiply charged ion beams at the mVINIS Ion Source, a novel method was developed based on a fluorescent screen and a commercial digital TV camera. The spatial characteristics of multiply charged ion beams (for example the ionization states of Ar2+ to Ar10+) have been precisely measured and analyzed at the TESLA Accelerator Installation for the first time. In this work, we discuss in details the characteristics of Ar8+ion beams. The obtained ion beam characteristics were compared with the results of previously applied conventional methods of ion beam diagnostics.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/58/1/097