Measurement of Energy Distribution of Output Electrons From a Microchannel Plate Based on Vacuum Photodiode

The energy distribution of output electrons (EDOE) from a microchannel plate (MCP) is measured using electrons emitted by a vacuum photodiode excited by a 266 nm Ti-sapphire femtosecond laser. The photoelectrons emitted from the photocathode are focused on a specific location of the MCP by a magneti...

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Bibliographic Details
Published in:IEEE access 2021, Vol.9, p.144080-144084
Main Authors: Huang, Junkun, Wang, Dong, Lei, Yunfei, Wang, Yong, Deng, Pokun, Cai, Houzhi, Liu, Jinyuan
Format: Article
Language:English
Subjects:
Electric potential
Electron energy
Energy
Energy distribution
Energy measurement
Femtosecond pulsed lasers
Ions
Light sources
Magnetic lenses
Measurement
Measurement by laser beam
microchannel plate
Microchannel plates
Microchannels
Oscilloscopes
output electron
Photocathodes
Photodiodes
Photoelectrons
Sapphire
Surface emitting lasers
Surface impedance
vacuum photodiode
Voltage
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Summary:The energy distribution of output electrons (EDOE) from a microchannel plate (MCP) is measured using electrons emitted by a vacuum photodiode excited by a 266 nm Ti-sapphire femtosecond laser. The photoelectrons emitted from the photocathode are focused on a specific location of the MCP by a magnetic lens. While exist an enough voltage difference between the two ends of MCP, the energy distribution curve of output electrons form MCP can be obtained by analyzing the data as function of the bias voltage applied to the charge collector. The result shows that the energy distribution curve obtained by this means consists of a sharp and a long tail when using pulse light source. The most probable electron energy (MPE) is 12.64 eV and the full width at half maximum (FWHM) of the energy distribution curve is about 29.23 eV while the applied voltage difference is 700 V in the experimental setup. The MPE is 10.63 eV and the FWHM of the energy distribution is 22.436 eV in simulation. The measured curve is consistent with the expectation from simulation.
ISSN:2169-3536
2169-3536
DOI:10.1109/ACCESS.2021.3121718