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The Effect of the Ion Beam Energy on M-plane InGaN Layer Preparation for STEM

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1702-1703
Main Authors: Nguyen, Trang, Dzuba, Brandon, Cao, Yang, Senichev, Alexander, Diaz, Rosa, Gardner, Geoffrey, Manfra, Michael, Malis, Oana
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619009243