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High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM

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Bibliographic Details
Published in:	Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1960-1961
Main Authors:	Allen, Frances I., Pekin, Thomas C., Persaud, Arun, Rozeveld, Steven J., Meyers, Gregory F., Ciston, Jim, Ophus, Colin, Minor, Andrew M.
Format:	Article
Language:	English
Subjects:	Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences Physical Science Symposia
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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