Examination of the Shape and Structure of (111)-oriented GaAs Tensile-Strained Quantum Dots using Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, and Atom Probe Tomography

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.2208-2209
Main Authors: Grossklaus, Kevin A., Schuck, Christopher F., Simmonds, Paul J., Vandervelde, Thomas E.
Format: Article
Language:English
Subjects:
Electron energy loss spectroscopy
Energy dissipation
Energy loss
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Physical Science Symposia
Quantum dots
Spectroscopy
Transmission electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619011772