First Auto-Magnifier Platform for Hardware Assurance and Reverse Engineering Integrated Circuits

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.226-227
Main Authors: Wilson, Ronald, Asadizanjani, Navid, Forte, Domenic, Woodard, Damon L.
Format: Article
Language:English
Subjects:
Algorithms
Analytical and Instrumentation Science Symposia
Automation
Computer engineering
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Failure analysis
Integrated circuits
Process controls
Reverse engineering
Scanning electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619001867