Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1834-1835
Main Authors: Miao, J., Casalena, L., Ciston, J., Pekin, T., Ghazisaeidi, M., Mills, M. J.
Format: Article
Language:English
Subjects:
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Physical Science Symposia
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619009905