Helios 5 – New Generation DualBeam Technology for Materials Science

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.524-525
Main Authors: Dutka, M., Van Leer, B.
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Materials science
Vendor Symposium
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Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619003350