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Controlled Environments from Sample Preparation to Electron Microscopy Characterization
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| Published in: | Microscopy and microanalysis 2019-08, Vol.25 (S2), p.698-699 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c2057-db8186d2888c87eb66189656158e9dbeb22297d438b70fcb9a076c00a4ec52b53 |
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| cites | cdi_FETCH-LOGICAL-c2057-db8186d2888c87eb66189656158e9dbeb22297d438b70fcb9a076c00a4ec52b53 |
| container_end_page | 699 |
| container_issue | S2 |
| container_start_page | 698 |
| container_title | Microscopy and microanalysis |
| container_volume | 25 |
| creator | Bonifacio, C.S. Nowakowski, P. Costello, K. Ray, M.L. Morrison, R. Fischione, P.E. |
| description | |
| doi_str_mv | 10.1017/S1431927619004227 |
| format | article |
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| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.698-699 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_2595846065 |
| source | Cambridge Journals Online |
| subjects | Analytical and Instrumentation Science Symposia Electron microscopy Microscopy and Microanalysis for Real-World Problem Solving Sample preparation |
| title | Controlled Environments from Sample Preparation to Electron Microscopy Characterization |
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