In situ TEM Approaches to Controlling the Growth of Semiconductors on 2D Materials

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1424-1425
Main Authors: Periwal, Priyanka, Thomsen, Joachim Dahl, Reuter, Mark C., Zakharov, Dmitri, Gignac, Lynne, Booth, Timothy J., Hofmann, Stephan, Ross, Frances M.
Format: Article
Language:English
Subjects:
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Physical Science Symposia
Two dimensional materials
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619007852