Impact of Electron Energy and Dose on Particle Dynamics Imaging in the Scanning Electron Microscope

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1670-1671
Main Authors: Gao, Yige, Srivastava, Satyam, Kim, Paul Y., Hoagland, David A., Russell, Thomas P., Ribbe, Alexander E.
Format: Article
Language:English
Subjects:
Electron energy
Physical Science Symposia
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Scanning electron microscopy
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619009085