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Method for tilt correction of calibration lines in high-resolution spectra
Technological advancement has led to improvement in the design capabilities of astronomical spectrographs, allowing for high-precision spectroscopy, thereby expanding the realms of observational astronomy. High-resolution spectrographs use echelle gratings that operate in higher orders, giving more...
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Published in: | Applied optics (2004) 2021-11, Vol.60 (31), p.9906 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | Technological advancement has led to improvement in the design capabilities of astronomical spectrographs, allowing for high-precision spectroscopy, thereby expanding the realms of observational astronomy. High-resolution spectrographs use echelle gratings that operate in higher orders, giving more detailed spectra. Often, curvature and tilted lines are observed in the spectra, arising due to the design trade-offs of the respective spectrographs. Removal of these artifacts can help avoid wrong flux calculation and line centroid position misinterpretation, which can aid in a better prediction of the wavelength calibration model. In this paper we present a postprocessing technique that we developed to correct the observed curvature and tilt in the spectra. We have demonstrated the correction technique on Fabry–Perot and Th-Ar calibration spectra obtained from a Hanle echelle spectrograph, a Magellan Inamori Kyocera Echelle spectrometer, and a X-Shooter spectrograph. |
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ISSN: | 1559-128X 2155-3165 |
DOI: | 10.1364/AO.434198 |