Reflectogram shape deformation in distributed fibre systems in the presence of spontaneous noise in the probe radiation

We report a study of the effect of spontaneous emission-induced noise in probe pulsed radiation on the reflectogram shape deformation in a distributed temperature sensor based on Raman scattering of light. Since the fraction of spontaneous emission in the used erbiumdoped amplifier can reach 50 % of...

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Bibliographic Details
Published in:Quantum electronics (Woodbury, N.Y.) N.Y.), 2021-12, Vol.51 (12), p.1107-1112
Main Authors: Kalmykov, N.I., Kovalenko, D.A., Lobach, I.A., Kablukov, S.I.
Format: Article
Language:English
Subjects:
Deformation
Deviation
distributed temperature sensor
Emission analysis
Erbium
Error analysis
Pulsed radiation
Radiation
Raman scattering of light
Raman spectra
reflectogram
spectral filtering
Spontaneous emission
Temperature measurement
Temperature sensors
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Summary:We report a study of the effect of spontaneous emission-induced noise in probe pulsed radiation on the reflectogram shape deformation in a distributed temperature sensor based on Raman scattering of light. Since the fraction of spontaneous emission in the used erbiumdoped amplifier can reach 50 % of the total power, this leads to deviations of reflectograms in the temperature sensor from the theoretical exponential dependence and, as a result, can yield a temperature measurement error of several degrees. Filtering the radiation with an amplitude modulator makes it possible to reduce these deviations. The influence of spontaneous emission on reflectograms is studied theoretically and experimentally.
ISSN:1063-7818
1468-4799
DOI:10.1070/QEL17661