X-Ray Diffraction Interferometer with One Slit: Computer Simulations and Analytics

A theoretical basis and a method of accurate computer simulations for studying the properties of X-ray diffraction interferometer with one slit are formulated. The slit serves as a secondary source of coherent divergent radiation, while the direct and reflected beams are split in space in a narrow g...

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Bibliographic Details
Published in:Crystallography reports 2021-11, Vol.66 (6), p.897-905
Main Authors: Kohn, V. G., Smirnova, I. A.
Format: Article
Language:English
Subjects:
Crystallography and Scattering Methods
Crystals
Diffraction and Scattering of Ionizing Radiations
Interference fringes
Interferometers
Physics
Physics and Astronomy
Thickness
X-ray diffraction
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Summary:A theoretical basis and a method of accurate computer simulations for studying the properties of X-ray diffraction interferometer with one slit are formulated. The slit serves as a secondary source of coherent divergent radiation, while the direct and reflected beams are split in space in a narrow gap between two crystal blocks. The theory is formulated for an arbitrary distance between the secondary source and a detector. Two most interesting cases are investigated in detail. It the first case the effect of diffraction focusing is realized for a thickness of the first crystal at a relatively large distance. This case is equivalent to a two-slit interferometer. In the second case, the distance is minimal, and thicknesses of the two blocks are equal. Here, an interference pattern can be obtained at a less total thickness of the blocks, and the experimental scheme is more compact. Analytical formulas for the interference fringe period and the beam widths under the Borrmann effect are derived.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774521060195