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A Study on the Phase Formation and Physical Characteristics of Hot-Dip Aluminized Coating at 750 °C
In this research, microstructure and crystallographic features of different phases generated on interstitial free steel hot dipped in Al-6.9Si-1.4Mg alloy melt was examined. Bath temperature was 750 °C for 0.5, 1, 3 and 6 min dipping. A combined arrangement of scanning electron microscopy (SEM), ene...
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Published in: | Metallography, microstructure, and analysis microstructure, and analysis, 2021-12, Vol.10 (6), p.823-838 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this research, microstructure and crystallographic features of different phases generated on interstitial free steel hot dipped in Al-6.9Si-1.4Mg alloy melt was examined. Bath temperature was 750 °C for 0.5, 1, 3 and 6 min dipping. A combined arrangement of scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and electron backscatter diffraction was used for phase identification. Results indicated that aluminized layer comprised of outer Al-Si alloy top-coat, thin FeAl
3
layer and a thick Fe
2
Al
5
layer in contact with steel substrate. Ternary Fe-Al-Si intermetallic compounds of Al
2
FeSi (
τ
3
) and Al
3
FeSi
2
(
τ
4
) were also identified. Elemental mapping, chemical composition analysis and in-depth composition profile of elements were done by electron probe microanalysis and glow discharge optical emission spectroscopy (GDOES). XRD study confirmed elemental silicon (Si) and magnesium (Mg) in the form of Mg
2
Si. SEM-EDS and GDOES studies confirm a sudden rise in Si at% at the top and in the intermetallic layer, which was attributed to the existence of Si-bearing phases or elemental pro-eutectic Si. The formability of the coated sheet was assessed by bending the samples at 180° to investigate the peeling-off of the outer coating layer from the steel surface. |
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ISSN: | 2192-9262 2192-9270 |
DOI: | 10.1007/s13632-021-00800-3 |