TOF-SIMS for carbon hybridization state analysis

Time-of-flight secondary ion mass spectra measured for different carbon allotropes under Bi3+ cluster ion bombardment were acquired. Ion yield of homogeneous (Cn)- and heterogeneous metal-carbon (CsCn)- secondary cluster ions was examined. Qualitative explanation of the regularities was given based...

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Bibliographic Details
Published in:Carbon (New York) 2022-01, Vol.186, p.83-90
Main Authors: Drozdov, M.N., Ieshkin, A.E., Streletskiy, O.A., Nishchak, O. Yu, Belykh, S.F., Tolstoguzov, A.
Format: Article
Language:English
Subjects:
Allotropy
Atomic collisions
Atoms & subatomic particles
Batteries
Carbon
Carbon allotropes
Clusters
Depth profiling
Hybridization
Ion bombardment
Ions
Mass spectra
Mass spectrometry
Nonlinear systems
Secondary ion mass spectrometry
Secondary ion yield
Sp-based carbon
Sputtering
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Summary:Time-of-flight secondary ion mass spectra measured for different carbon allotropes under Bi3+ cluster ion bombardment were acquired. Ion yield of homogeneous (Cn)- and heterogeneous metal-carbon (CsCn)- secondary cluster ions was examined. Qualitative explanation of the regularities was given based on the concept of nonlinear atomic collision cascades. It was suggested that the features of secondary cluster yield can be used for determination of hybridization state of the target material. Unlike most other techniques, secondary ion mass spectrometry is capable of the sputter depth profiling of the hybridization state. [Display omitted]
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2021.10.007