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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. For instance, buried parts in stratified nanostructu...
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Published in: | Small (Weinheim an der Bergstrasse, Germany) Germany), 2022-02, Vol.18 (6), p.e2105776-n/a |
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creator | Hönicke, Philipp Kayser, Yves Nikolaev, Konstantin V. Soltwisch, Victor Scheerder, Jeroen E. Fleischmann, Claudia Siefke, Thomas Andrle, Anna Gwalt, Grzegorz Siewert, Frank Davis, Jeffrey Huth, Martin Veloso, Anabela Loo, Roger Skroblin, Dieter Steinert, Michael Undisz, Andreas Rettenmayr, Markus Beckhoff, Burkhard |
description | The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. For instance, buried parts in stratified nanostructures, which are often crucial for device functionality, can only be probed in a destructive manner in few locations as many existing nondestructive techniques only probe the objects surfaces. Here, it is demonstrated that grazing exit X‐ray fluorescence can simultaneously characterize an ensemble of regularly ordered nanostructures simultaneously with respect to their dimensional properties and their elemental composition. This technique is nondestructive and compatible to typically sized test fields, allowing the same array of structures to be studied by other techniques. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it does not require access‐limited large‐scale research facilities as it is compatible to laboratory‐scale instrumentation.
Ordered arrays of complex 3D nanostructures are being characterized with respect to their dimensional and analytical properties employing nondestructive X‐ray fluorescence analysis in grazing exit geometry. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it is compatible to typically sized test fields. |
doi_str_mv | 10.1002/smll.202105776 |
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Ordered arrays of complex 3D nanostructures are being characterized with respect to their dimensional and analytical properties employing nondestructive X‐ray fluorescence analysis in grazing exit geometry. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it is compatible to typically sized test fields.</description><identifier>ISSN: 1613-6810</identifier><identifier>EISSN: 1613-6829</identifier><identifier>DOI: 10.1002/smll.202105776</identifier><identifier>PMID: 34821030</identifier><language>eng</language><publisher>Germany: Wiley Subscription Services, Inc</publisher><subject>Dimensional analysis ; dimensional and compositional analysis ; Fluorescence ; grazing exit X‐ray fluorescence ; machine learning ; Nanostructure ; nanostructure characterization ; Nanostructures - chemistry ; Nanotechnology ; Nondestructive testing ; Research facilities</subject><ispartof>Small (Weinheim an der Bergstrasse, Germany), 2022-02, Vol.18 (6), p.e2105776-n/a</ispartof><rights>2021 The Authors. Small published by Wiley‐VCH GmbH</rights><rights>2021 The Authors. Small published by Wiley-VCH GmbH.</rights><rights>2021. This article is published under http://creativecommons.org/licenses/by-nc/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4136-c375ab4fa927a85736c236f37c89df13c52d23e2bc08eff9841672cffb0519773</citedby><cites>FETCH-LOGICAL-c4136-c375ab4fa927a85736c236f37c89df13c52d23e2bc08eff9841672cffb0519773</cites><orcidid>0000-0001-8469-8589 ; 0000-0002-4752-9599 ; 0000-0001-6459-5208 ; 0000-0002-9301-0392 ; 0000-0003-3513-6058 ; 0000-0002-0301-2918 ; 0000-0002-0712-903X ; 0000-0002-8197-2113</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/34821030$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Hönicke, Philipp</creatorcontrib><creatorcontrib>Kayser, Yves</creatorcontrib><creatorcontrib>Nikolaev, Konstantin V.</creatorcontrib><creatorcontrib>Soltwisch, Victor</creatorcontrib><creatorcontrib>Scheerder, Jeroen E.</creatorcontrib><creatorcontrib>Fleischmann, Claudia</creatorcontrib><creatorcontrib>Siefke, Thomas</creatorcontrib><creatorcontrib>Andrle, Anna</creatorcontrib><creatorcontrib>Gwalt, Grzegorz</creatorcontrib><creatorcontrib>Siewert, Frank</creatorcontrib><creatorcontrib>Davis, Jeffrey</creatorcontrib><creatorcontrib>Huth, Martin</creatorcontrib><creatorcontrib>Veloso, Anabela</creatorcontrib><creatorcontrib>Loo, Roger</creatorcontrib><creatorcontrib>Skroblin, Dieter</creatorcontrib><creatorcontrib>Steinert, Michael</creatorcontrib><creatorcontrib>Undisz, Andreas</creatorcontrib><creatorcontrib>Rettenmayr, Markus</creatorcontrib><creatorcontrib>Beckhoff, Burkhard</creatorcontrib><title>Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures</title><title>Small (Weinheim an der Bergstrasse, Germany)</title><addtitle>Small</addtitle><description>The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. For instance, buried parts in stratified nanostructures, which are often crucial for device functionality, can only be probed in a destructive manner in few locations as many existing nondestructive techniques only probe the objects surfaces. Here, it is demonstrated that grazing exit X‐ray fluorescence can simultaneously characterize an ensemble of regularly ordered nanostructures simultaneously with respect to their dimensional properties and their elemental composition. This technique is nondestructive and compatible to typically sized test fields, allowing the same array of structures to be studied by other techniques. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it does not require access‐limited large‐scale research facilities as it is compatible to laboratory‐scale instrumentation.
Ordered arrays of complex 3D nanostructures are being characterized with respect to their dimensional and analytical properties employing nondestructive X‐ray fluorescence analysis in grazing exit geometry. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it is compatible to typically sized test fields.</description><subject>Dimensional analysis</subject><subject>dimensional and compositional analysis</subject><subject>Fluorescence</subject><subject>grazing exit X‐ray fluorescence</subject><subject>machine learning</subject><subject>Nanostructure</subject><subject>nanostructure characterization</subject><subject>Nanostructures - chemistry</subject><subject>Nanotechnology</subject><subject>Nondestructive testing</subject><subject>Research facilities</subject><issn>1613-6810</issn><issn>1613-6829</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><recordid>eNqFkEtLAzEURoMotla3LmXA9dS8JplZlvqE0YLVdchkEkyZR00mSP31prTWpat7L5zv43IAuERwiiDEN75tmimGGMGMc3YExoghkrIcF8eHHcEROPN-BSFBmPJTMCI0jwkCx-B1advQDLLTffDJrW11523fySaRXZ3M4rIZrIrn_EM6qQbt7LccIpH0Jlm4WjtdJy-y6_3gghqC0_4cnBjZeH2xnxPwfn_3Nn9My8XD03xWpooiwlJFeCYramSBucwzTpjChBnCVV7UBhGV4RoTjSsFc21MkVPEOFbGVDBDBedkAq53vWvXfwbtB7Hqg4sfe4EZ5pCyjJJITXeUcr33ThuxdraVbiMQFFuFYqtQHBTGwNW-NlStrg_4r7MIFDvgyzZ680-dWD6X5V_5DyCbfkY</recordid><startdate>20220201</startdate><enddate>20220201</enddate><creator>Hönicke, Philipp</creator><creator>Kayser, Yves</creator><creator>Nikolaev, Konstantin V.</creator><creator>Soltwisch, Victor</creator><creator>Scheerder, Jeroen E.</creator><creator>Fleischmann, Claudia</creator><creator>Siefke, Thomas</creator><creator>Andrle, Anna</creator><creator>Gwalt, Grzegorz</creator><creator>Siewert, Frank</creator><creator>Davis, Jeffrey</creator><creator>Huth, Martin</creator><creator>Veloso, Anabela</creator><creator>Loo, Roger</creator><creator>Skroblin, Dieter</creator><creator>Steinert, Michael</creator><creator>Undisz, Andreas</creator><creator>Rettenmayr, Markus</creator><creator>Beckhoff, Burkhard</creator><general>Wiley Subscription Services, Inc</general><scope>24P</scope><scope>WIN</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-8469-8589</orcidid><orcidid>https://orcid.org/0000-0002-4752-9599</orcidid><orcidid>https://orcid.org/0000-0001-6459-5208</orcidid><orcidid>https://orcid.org/0000-0002-9301-0392</orcidid><orcidid>https://orcid.org/0000-0003-3513-6058</orcidid><orcidid>https://orcid.org/0000-0002-0301-2918</orcidid><orcidid>https://orcid.org/0000-0002-0712-903X</orcidid><orcidid>https://orcid.org/0000-0002-8197-2113</orcidid></search><sort><creationdate>20220201</creationdate><title>Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures</title><author>Hönicke, Philipp ; Kayser, Yves ; Nikolaev, Konstantin V. ; Soltwisch, Victor ; Scheerder, Jeroen E. ; Fleischmann, Claudia ; Siefke, Thomas ; Andrle, Anna ; Gwalt, Grzegorz ; Siewert, Frank ; Davis, Jeffrey ; Huth, Martin ; Veloso, Anabela ; Loo, Roger ; Skroblin, Dieter ; Steinert, Michael ; Undisz, Andreas ; Rettenmayr, Markus ; Beckhoff, Burkhard</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4136-c375ab4fa927a85736c236f37c89df13c52d23e2bc08eff9841672cffb0519773</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Dimensional analysis</topic><topic>dimensional and compositional analysis</topic><topic>Fluorescence</topic><topic>grazing exit X‐ray fluorescence</topic><topic>machine learning</topic><topic>Nanostructure</topic><topic>nanostructure characterization</topic><topic>Nanostructures - chemistry</topic><topic>Nanotechnology</topic><topic>Nondestructive testing</topic><topic>Research facilities</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hönicke, Philipp</creatorcontrib><creatorcontrib>Kayser, Yves</creatorcontrib><creatorcontrib>Nikolaev, Konstantin V.</creatorcontrib><creatorcontrib>Soltwisch, Victor</creatorcontrib><creatorcontrib>Scheerder, Jeroen E.</creatorcontrib><creatorcontrib>Fleischmann, Claudia</creatorcontrib><creatorcontrib>Siefke, Thomas</creatorcontrib><creatorcontrib>Andrle, Anna</creatorcontrib><creatorcontrib>Gwalt, Grzegorz</creatorcontrib><creatorcontrib>Siewert, Frank</creatorcontrib><creatorcontrib>Davis, Jeffrey</creatorcontrib><creatorcontrib>Huth, Martin</creatorcontrib><creatorcontrib>Veloso, Anabela</creatorcontrib><creatorcontrib>Loo, Roger</creatorcontrib><creatorcontrib>Skroblin, Dieter</creatorcontrib><creatorcontrib>Steinert, Michael</creatorcontrib><creatorcontrib>Undisz, Andreas</creatorcontrib><creatorcontrib>Rettenmayr, Markus</creatorcontrib><creatorcontrib>Beckhoff, Burkhard</creatorcontrib><collection>Wiley Online Library Open Access</collection><collection>Wiley Online Library Free Content</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Small (Weinheim an der Bergstrasse, Germany)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hönicke, Philipp</au><au>Kayser, Yves</au><au>Nikolaev, Konstantin V.</au><au>Soltwisch, Victor</au><au>Scheerder, Jeroen E.</au><au>Fleischmann, Claudia</au><au>Siefke, Thomas</au><au>Andrle, Anna</au><au>Gwalt, Grzegorz</au><au>Siewert, Frank</au><au>Davis, Jeffrey</au><au>Huth, Martin</au><au>Veloso, Anabela</au><au>Loo, Roger</au><au>Skroblin, Dieter</au><au>Steinert, Michael</au><au>Undisz, Andreas</au><au>Rettenmayr, Markus</au><au>Beckhoff, Burkhard</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures</atitle><jtitle>Small (Weinheim an der Bergstrasse, Germany)</jtitle><addtitle>Small</addtitle><date>2022-02-01</date><risdate>2022</risdate><volume>18</volume><issue>6</issue><spage>e2105776</spage><epage>n/a</epage><pages>e2105776-n/a</pages><issn>1613-6810</issn><eissn>1613-6829</eissn><abstract>The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. 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Ordered arrays of complex 3D nanostructures are being characterized with respect to their dimensional and analytical properties employing nondestructive X‐ray fluorescence analysis in grazing exit geometry. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it is compatible to typically sized test fields.</abstract><cop>Germany</cop><pub>Wiley Subscription Services, Inc</pub><pmid>34821030</pmid><doi>10.1002/smll.202105776</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0001-8469-8589</orcidid><orcidid>https://orcid.org/0000-0002-4752-9599</orcidid><orcidid>https://orcid.org/0000-0001-6459-5208</orcidid><orcidid>https://orcid.org/0000-0002-9301-0392</orcidid><orcidid>https://orcid.org/0000-0003-3513-6058</orcidid><orcidid>https://orcid.org/0000-0002-0301-2918</orcidid><orcidid>https://orcid.org/0000-0002-0712-903X</orcidid><orcidid>https://orcid.org/0000-0002-8197-2113</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Dimensional analysis dimensional and compositional analysis Fluorescence grazing exit X‐ray fluorescence machine learning Nanostructure nanostructure characterization Nanostructures - chemistry Nanotechnology Nondestructive testing Research facilities |
title | Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures |
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