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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. For instance, buried parts in stratified nanostructu...

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Published in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2022-02, Vol.18 (6), p.e2105776-n/a
Main Authors: Hönicke, Philipp, Kayser, Yves, Nikolaev, Konstantin V., Soltwisch, Victor, Scheerder, Jeroen E., Fleischmann, Claudia, Siefke, Thomas, Andrle, Anna, Gwalt, Grzegorz, Siewert, Frank, Davis, Jeffrey, Huth, Martin, Veloso, Anabela, Loo, Roger, Skroblin, Dieter, Steinert, Michael, Undisz, Andreas, Rettenmayr, Markus, Beckhoff, Burkhard
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creator Hönicke, Philipp
Kayser, Yves
Nikolaev, Konstantin V.
Soltwisch, Victor
Scheerder, Jeroen E.
Fleischmann, Claudia
Siefke, Thomas
Andrle, Anna
Gwalt, Grzegorz
Siewert, Frank
Davis, Jeffrey
Huth, Martin
Veloso, Anabela
Loo, Roger
Skroblin, Dieter
Steinert, Michael
Undisz, Andreas
Rettenmayr, Markus
Beckhoff, Burkhard
description The spatial and compositional complexity of 3D structures employed in today's nanotechnologies has developed to a level at which the requirements for process development and control can no longer fully be met by existing metrology techniques. For instance, buried parts in stratified nanostructures, which are often crucial for device functionality, can only be probed in a destructive manner in few locations as many existing nondestructive techniques only probe the objects surfaces. Here, it is demonstrated that grazing exit X‐ray fluorescence can simultaneously characterize an ensemble of regularly ordered nanostructures simultaneously with respect to their dimensional properties and their elemental composition. This technique is nondestructive and compatible to typically sized test fields, allowing the same array of structures to be studied by other techniques. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it does not require access‐limited large‐scale research facilities as it is compatible to laboratory‐scale instrumentation. Ordered arrays of complex 3D nanostructures are being characterized with respect to their dimensional and analytical properties employing nondestructive X‐ray fluorescence analysis in grazing exit geometry. For crucial parameters, the technique provides sub‐nm discrimination capabilities and it is compatible to typically sized test fields.
doi_str_mv 10.1002/smll.202105776
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subjects Dimensional analysis
dimensional and compositional analysis
Fluorescence
grazing exit X‐ray fluorescence
machine learning
Nanostructure
nanostructure characterization
Nanostructures - chemistry
Nanotechnology
Nondestructive testing
Research facilities
title Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
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