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Effect of morphology and stacking on atomic interaction and magnetic characteristics in two-dimensional H-phase VS2 few layers
Recently, the research of two-dimensional layered transition metal dichalcogenides has made great progress due to their high potential in advanced electronic devices. In this work, H- phase VS 2 atomic layers with different morphologies and stacking orders were successfully synthesized on sapphire v...
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Published in: | Journal of materials science 2022-03, Vol.57 (10), p.5873-5884 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Recently, the research of two-dimensional layered transition metal dichalcogenides has made great progress due to their high potential in advanced electronic devices. In this work,
H-
phase VS
2
atomic layers with different morphologies and stacking orders were successfully synthesized on sapphire via chemical vapor deposition. The
H-
phase VS
2
shows semiconductor characteristic with its valence band maximum located ~ 0.25 eV below the Fermi level. Interlayer many-body interactions are strongly stacking-dependent, leading to distinguished intensity ratio between the breathing and shear modes, 2.99 ± 0.94 for AA, and 1.72 ± 0.26 for AB stacking. The intralayer S-V interaction (force constant: 2.80–3.54 × 10
21
N/m
3
) is two orders of magnitude larger than the interlayer S–S interaction (force constant: 1.98–6.70 × 10
19
N/m
3
). The shear modulus is further derived to be ~ 12.8 GPa, ~ 30% smaller than that of MoS
2
. The prepared VS
2
film exhibits obvious magnetic behavior at room temperature with the attenuation distance of ~ 16–25 nm in out-of-plane direction. The morphology dependent magnetism and stability investigations indicate that the measured magnetic behaviors of the sample have a certain degree of extrinsic contributions, which may settle down some experimental controversies about the magnetic behaviors in this specific system. |
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ISSN: | 0022-2461 1573-4803 |
DOI: | 10.1007/s10853-022-06904-7 |