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Radiometric Studies of Leakage Currents in Dielectrics
A new experimental method for measuring leakage currents (conduction currents) in dielectrics, based on the analysis of the dynamics of sample temperature variation under an electric field is proposed. The temperature response of the sample is recorded with high accuracy and speed using a non-contac...
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Published in: | Physics of the solid state 2021-06, Vol.63 (6), p.932-936 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | A new experimental method for measuring leakage currents (conduction currents) in dielectrics, based on the analysis of the dynamics of sample temperature variation under an electric field is proposed. The temperature response of the sample is recorded with high accuracy and speed using a non-contact photodiode IR-temperature sensor. The method capability is demonstrated on 0.65PbFe
2/3
W
1/3
O
3
–0.35PbTiO
3
(PFW–PT) ceramics samples for which experimental dependences of the conductivity are measured in a wide temperature range from 20 to 110°C. |
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ISSN: | 1063-7834 1090-6460 |
DOI: | 10.1134/S1063783421060226 |