Non-destructive evaluation of thickness of material plates through Compton back-scattering technique using Si(Li) detector

This study aims to develop the system for the non-destructive evaluation of the thickness of material plates based on the Compton back-scattering technique using a Si(Li) detector and 241Am radioactive sources. The calibration curve is constructed based on the areas under the Compton scattering peak...

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Bibliographic Details
Published in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2022-04, Vol.193, p.109978, Article 109978
Main Authors: Chuong, Huynh Dinh, Thong, Nguyen Duy, Nguyen, Vo Hoang, Minh, Le Hoang, Truc Linh, Nguyen Thi, Ho, Phan Long, Thanh, Tran Thien, Van Tao, Chau
Format: Article
Language:English
Subjects:
Aluminum
Calibration
Compton back-scattering technique
Correlation coefficients
Elastic scattering
Material plate
Nondestructive testing
Plates
Si(Li) detector
Thickness measurement
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Summary:This study aims to develop the system for the non-destructive evaluation of the thickness of material plates based on the Compton back-scattering technique using a Si(Li) detector and 241Am radioactive sources. The calibration curve is constructed based on the areas under the Compton scattering peak obtained from the measurements of reference samples. This calibration curve is used to determine the saturation thickness, the maximum measurable thickness (MMT) with the desired accuracy, and the unknown thickness of a sample. To validate the reliability of the system, we have performed thickness measurements for seventeen aluminum samples with different thicknesses in the range of 4.40–21.07 mm. The samples are measured seven times, except for two samples with thicknesses of 11.52 mm and 14.98 mm up to twenty times. The Pearson's correlation coefficient between the reference and measured thicknesses presented a strong positive correlation. The average relative deviation between the reference and measured thicknesses is less than 1%. •Compton back-scattering technique using 241Am source and Si(Li) detector was verified.•The calibration curves of areas under the Compton scattering peak were constructed.•Saturation thickness for aluminum material at scattering angle of 150° was confirmed.•Compton back-scattering technique for measuring accurately for thin samples was estimated.
ISSN:0969-806X
1879-0895
DOI:10.1016/j.radphyschem.2022.109978