Flying probe measurement accuracy improvement by external LCR integration

This paper presents a procedure for integrating external stand-alone measurement with the Takaya APT Flying Probe machine (FP). The proposed approach can serve as a guide for merging other types of external test and measurement devices (T&M). The work context resides in a measurement inaccuracy...

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Bibliographic Details
Published in:Measurement : journal of the International Measurement Confederation 2022-02, Vol.190, p.110703, Article 110703
Main Authors: Ionel, Raul, Mâțiu-Iovan, Liliana
Format: Article
Language:English
Subjects:
Automobile industry
Capacitors
Circuit boards
Energy storage
Evaluation
Flying probe
Inductors
Integration
LCR meter
Measurement accuracy improvement
Measuring instruments
Printed circuit boards
Software
Virtual instrumentation
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Summary:This paper presents a procedure for integrating external stand-alone measurement with the Takaya APT Flying Probe machine (FP). The proposed approach can serve as a guide for merging other types of external test and measurement devices (T&M). The work context resides in a measurement inaccuracy situation reported at a production facility, by one of the most important worldwide automotive manufacturers. In the case of some printed circuit boards (PCBs), the FP machine generated erroneous results when measuring values for different in-circuit-mounted capacitors and inductors. The aim of our work was to resolve this situation. Thus, an integration solution which extends FP measurement capabilities was investigated and deployed. Developed applications operate as an extension of the FP software interface and can be included as a single step within the classical FP test program. Capacitors in the 1 nF to 100 nF ranges were tested. The solution proves viable for measurements on the 10 nF to 100 nF range, where the maximum relative error was 5.28%. Inductors with nominal values in the range 3.3 μH to 100 μH were evaluated with maximum relative errors of 10%. The presented solution proved to be well-suited for testing capacitors higher than 10 nF, while excellent results could be observed in the case of evaluated inductors. A statistical measurement accuracy evaluation demonstrates the appropriateness of such a solution.
ISSN:0263-2241
1873-412X
DOI:10.1016/j.measurement.2022.110703