Optical and electrical properties of room temperature prepared α-IGZO thin films using an In2Ga2ZnO7 ceramic target

In this study, a high-purity In 2 Ga 2 ZnO 7 ceramic target was used to deposit indium gallium zinc oxide (IGZO) films by RF magnetron sputtering technology. The microstructure, growth state, optical and electrical properties of the IGZO films were studied. The results showed that the surface of the...

Full description

Saved in:
Bibliographic Details
Published in:Journal of Central South University 2022-04, Vol.29 (4), p.1062-1074
Main Authors: Zhang, Yu, Chen, Jie, Sun, Ben-shuang, Liu, Shuai, Wang, Zhi-jun, Liu, Shu-han, Shu, Yong-chun, He, Ji-lin
Format: Article
Language:English
Subjects:
Atomic force microscopes
Atomic force microscopy
Electrical properties
Engineering
Gallium
Indium gallium zinc oxide
Magnetic properties
Magnetron sputtering
Metallic Materials
Optical properties
Oxygen
Photoelectrons
Room temperature
Substrates
Surface roughness
Thin films
Vacancies
X ray photoelectron spectroscopy
Zinc oxide
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this study, a high-purity In 2 Ga 2 ZnO 7 ceramic target was used to deposit indium gallium zinc oxide (IGZO) films by RF magnetron sputtering technology. The microstructure, growth state, optical and electrical properties of the IGZO films were studied. The results showed that the surface of the IGZO film was uniform and smooth at room temperature. As the substrate temperature increased, the surface roughness of the film gradually increased. From room temperature to 300 ° C, all the films maintained amorphous phase and good thermal stabilities. Moreover, the transmission in the visible region decreased from 91.93% to 91.08%, and the band gap slightly decreased from 3.79 to 3.76 eV. The characterization of the film via atomic force microscope (AFM) and X-ray photoelectron spectroscopy (XPS) demonstrated that the film prepared at room temperature exhibited the lowest surface roughness and the largest content of oxygen vacancies. With the rise in temperature, the non-homogeneous particle distribution, increase in the surface roughness, and reduction in the number of oxygen vacancies resulted in lower performance of the α -IGZO film. Comprehensive analysis showed that the best optical and electrical properties can be obtained by depositing IGZO films at room temperature, which indicates their potential applications in flexible substrates.
ISSN:2095-2899
2227-5223
DOI:10.1007/s11771-022-4978-9