Retrieval of the complex reflection coefficient from nano scale thin films by using polarized neutrons and magnetic substrates

• Published in: Applied physics. A, Materials science & processing Materials science & processing, 2007-01, Vol.86 (1), p.95-100
• Main Authors: MASOUDI, S. F, VAEZZADEH, M, GOLAFROUZ, M, JAFARI, G. R
• Format: Article
• Language: English
• Subjects: Applied physics; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Interface stability; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties; Materials science; Physics; Polarization; Reflectance; Specular reflection; Substrates; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin films
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-006-3735-5

A method is proposed for overcoming the famous ‘phase problem’ in neutron specular reflectometry. It is shown that the complex reflection coefficient of any unknown non magnetic layer, with real scattering length density, can be determined by using a magnetic transmitted media and by measuring the polarization of the reflected beam relative to the incident beam. The method follows directly from a recent one which is limited to a one-dimensional neutron polarization. Here, the theory is generalized for a neutron polarization of arbitrary direction. We show that some combinations between the polarization of the incident and reflected beam must be used to determine the reflection coefficient. Also, it is shown that instead of full polarization or reflectivity analysis, some combinations between polarization and reflectivity can be used in the analysis process. The method is supplemented with a schematic example to test the method and its stability in the presence of experimental uncertainties and roughness of the interfaces.