Secondary-ion mass spectrometry of photoconducting targets

Secondary-ion mass spectrometry of photoconducting CdS-PbS films has revealed a change in the yield of positive secondary ions upon illumination. In the course of bombardment by positive oxygen ions, illumination of the samples by visible light decreases the yield of cadmium ions and increases that...

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Bibliographic Details
Published in:Technical physics 2007-11, Vol.52 (11), p.1483-1489
Main Authors: Serdobintsev, A. A., Rokakh, A. G., Stetsyura, S. V., Zhukov, A. G.
Format: Article
Language:English
Subjects:
Illumination
Ion bombardment
Mass spectrometry
Oxygen ions
Scientific imaging
Secondary ion mass spectrometry
Spectroscopy
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Summary:Secondary-ion mass spectrometry of photoconducting CdS-PbS films has revealed a change in the yield of positive secondary ions upon illumination. In the course of bombardment by positive oxygen ions, illumination of the samples by visible light decreases the yield of cadmium ions and increases that of lead ions. The observed phenomena suggest that the secondary-ion photoeffect takes place; these phenomena are called the normal and anomalous secondary-ion photoeffect, respectively. The phenomena observed are explained, and a preliminary quantitative description of these effects is proposed.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784207110163