Tailoring the multiferroic properties of BiFeO3 by low energy ions implantation

This work presents the implantation of various ions, such as Au + , As + , Ge + , Y + , and Co + , to modify the structural parameters, surface morphology, and multiferroic properties of BiFeO 3 (BFO) ceramics. All the samples were synthesized using the solid-state reaction method. Significant varia...

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Bibliographic Details
Published in:Journal of electroceramics 2021, Vol.47 (3), p.100-117
Main Authors: Sharif, Sadia, Murtaza, G., Khan, Muhammad Azhar, Sadaf, Asma, Al-Muhimeed, Tahani I., Nazir, Ghazanfar
Format: Article
Language:English
Subjects:
Bismuth ferrite
Ceramics
Characterization and Evaluation of Materials
Chemistry and Materials Science
Composites
Crystallography and Scattering Methods
Electrochemistry
Ferroelectric materials
Ferroelectricity
Ferromagnetism
Fluence
Glass
Grain size
Ion implantation
Mass transport
Materials Science
Morphology
Multiferroic materials
Natural Materials
Optical and Electronic Materials
Parameter modification
X ray photoelectron spectroscopy
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Summary:This work presents the implantation of various ions, such as Au + , As + , Ge + , Y + , and Co + , to modify the structural parameters, surface morphology, and multiferroic properties of BiFeO 3 (BFO) ceramics. All the samples were synthesized using the solid-state reaction method. Significant variations in the structural, morphological, ferroelectric, and ferromagnetic properties of BFO were observed due to the implantation of various ions using 500 keV at ion fluence of ~ 3 × 10 12 ions/cm 2 . X-ray diffractometer patterns showed structural distortion in the implanted samples. Scanning Electron Microscopy (SEM) images exhibited definite grain size variation over the surface due to mass transport. The X-ray Photon Spectroscopy (XPS) indicated the successful implantation of all ions and revealed the impact of Fe 2+ /Fe 3+ concentrations in irradiated samples. The magnetic and ferroelectric loops revealed the improved ferroelectric/ferromagnetic behaviour of BFO due to implantations.
ISSN:1385-3449
1573-8663
DOI:10.1007/s10832-021-00258-3