Magnetron-sputtered and thermal-evaporated low-loss Sb-Se phase-change films in non-volatile integrated photonics

• Published in: Optical materials express 2022-07, Vol.12 (7), p.2815
• Main Authors: Lei, Kunhao, Wei, Maoliang, Chen, Zequn, Wu, Jianghong, Jian, Jialing, Du, Jia, Li, Junying, Li, Lan, Lin, Hongtao
• Format: Article
• Language: English
• Subjects: Crystal structure; Crystallinity; Crystallization; Ellipsometry; Evaporation; Integrated circuits; Optical properties; Phase change materials; Photonic crystals; Power consumption; Refractivity; Silicon; Thermal energy; Thin films; Wave propagation; Waveguides
• ISSN: 2159-3930; 2159-3930
• DOI: 10.1364/OME.462426

Chalcogenide phase change materials (PCMs), featuring a large contrast in optical properties between their non-volatile amorphous and crystalline states, have triggered a surge of interest for their applications in ultra-compact photonic integrated circuits with long-term near-zero power consumption. Over the past decade, however, PCM-integrated photonic devices and networks suffered from the huge optical loss of various commonly-used PCMs themselves. In this paper, we focused on the deposition, characterization, and monolithic integration of an emerging low-loss phase change material, Sb 2 Se 3 on a silicon photonic platform. The refractive index contrast between the amorphous and crystalline phase of the evaporated Sb-Se thin film was optimized up to 0.823 while the extinction coefficient remains less than 10 −5 measured by ellipsometry. When integrated on a silicon waveguide, the propagation loss introduced by the amorphous thin film is negligibly low. After crystallization, the propagation loss of a magnetron-sputtered Sb-Se patch-covered silicon waveguide is as low as 0.019 dB/µm, while its thermal-evaporated counterpart is below 0.036 dB/µm.