RETRACTED ARTICLE: Tailoring of optical properties of Se80Te20-xInx films by annealing process

• Published in: Applied physics. A, Materials science & processing Materials science & processing, 2022, Vol.128 (8), Article 643
• Main Authors: Abdelalim, Youssef H., Sakr, Abdel-Hamid A., El-Ghanam, S. M., Hamad, Mahmoud A.
• Format: Article
• Language: English
• Subjects: Annealing; Applied physics; Characterization and Evaluation of Materials; Condensed Matter Physics; Crystallites; Energy gap; Glass substrates; Lattice strain; Machines; Manufacturing; Materials science; Nanotechnology; Optical and Electronic Materials; Optical properties; Physical properties; Physics; Physics and Astronomy; Processes; Refractivity; Surfaces and Interfaces; Thin Films
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-022-05736-1

Bulk chalcogenide glass materials of Se 80 Te 20- x In x ( x  = 0, 3, 6, 9 and 11) were prepared via the melting-quenching technique. Se 80 Te 20- x In x thin films were evaporated thermally on glass substrates. The results of this study revealed that In doping and annealing time resulted in significant tailoring of some physical properties of Se 80 Te 20- x In x thin films. The annealing process changes the amorphous nature of Se 80 Te 20- x In x thin films to a crystal one. As both In content and annealing time increase, crystallite size decreases and internal lattice strain increases for all samples except those with x  = 11. Refractive indices for Se 80 Te 20- x In x thin films were fitted according to the main parameters of the single-oscillator model. It was also discovered that Se 80 Te 20- x In x thin films have a high absorption of high-energy photons. The increasing annealing time improves the refractive index. The bandgap got smaller when the annealing time was increased.