Improving the electrostatic design of the Jefferson Lab 300 kV DC photogun

• Published in: Review of scientific instruments 2022-07, Vol.93 (7), p.073303-073303
• Main Authors: Wijethunga, S. A. K., Mamun, M. A., Suleiman, R., Hernandez-Garcia, C., Bullard, B., Delayen, J. R., Grames, J., Krafft, G. A., Palacios-Serrano, G., Poelker, M.
• Format: Article
• Language: English
• Subjects: Anodes; Cathodes; Design modifications; Electric fields; Electrodes; Electron beams; High voltages; Photocathodes; Pulse duration; Scientific apparatus & instruments
• ISSN: 0034-6748; 1089-7623
• DOI: 10.1063/5.0091134

The 300 kV DC high voltage photogun at Jefferson Lab was redesigned to deliver electron beams with a much higher bunch charge and improved beam properties. The original design provided only a modest longitudinal electric field (Ez) at the photocathode, which limited the achievable extracted bunch charge. To reach the bunch charge goal of approximately few nC with 75 ps full-width at half-maximum Gaussian laser pulse width, the existing DC high voltage photogun electrodes and anode–cathode gap were modified to increase Ez at the photocathode. In addition, the anode aperture was spatially shifted with respect to the beamline longitudinal axis to minimize the beam deflection introduced by the non-symmetric nature of the inverted insulator photogun design. We present the electrostatic design of the original photogun and the modified photogun and beam dynamics simulations that predict vastly improved performance. We also quantify the impact of the photocathode recess on beam quality, where recess describes the actual location of the photocathode inside the photogun cathode electrode relative to the intended location. A photocathode unintentionally recessed/misplaced by sub-millimeter distance can significantly impact the downstream beam size.