Roughness spectroscopy of particle monolayer: Implications for spectral analysis of the monolayer image

• Published in: Measurement : journal of the International Measurement Confederation 2022-06, Vol.196, p.111263, Article 111263
• Main Authors: Weroński, Paweł, Pałka, Karolina
• Format: Article
• Language: English
• Subjects: 2D random packing; Form factor; Monolayers; Numerical analysis; Parameterization; Particle image analysis; Polystyrene; Polystyrene resins; Power spectral density; Radial distribution function; Scattering; Spectrum analysis; Static structure factor; Surface roughness
• ISSN: 0263-2241; 1873-412X
• DOI: 10.1016/j.measurement.2022.111263

The surface roughness of a particle monolayer is one of its fundamental characteristics, conventionally described in terms of power spectral density. We derive a general equation for this function and demonstrate its similarity to those applied in the theory of scattering. To validate our analytical results, we compare them with numerical results derived for a monolayer of 450nm spherical particles, of surface coverage 0.85. We also demonstrate a practical application of our approach on the example of spectral analysis of a SEM image of a polystyrene particle monolayer of surface coverage close to 0.5. Our theoretical model provides a general framework for a cheap and easy parametrization of particle monolayers. [Display omitted] •Analytical equations for the power spectral density of dense particle monolayer.•Close analogy between equations for power spectral density and radiation scattering.•Numerical validation of analytical equations for monolayer surface roughness.•Spectral analysis of the monolayer image for the quick monolayer characterization.