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The Case for Lower Voltage TEMs: A 100 keV FEG for High Resolution Microscopy

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Bibliographic Details
Published in:	Microscopy and microanalysis 2022-08, Vol.28 (S1), p.1168-1169
Main Authors:	El-Gomati, Mohamed M., Wells, Torquil, Zha, Xiaoping, Sykes, Richard, Russo, Christopher J., Henderson, Richard, McMullan, Greg
Format:	Article
Language:	English
Subjects:	Biological Sciences Symposia Technical Advances in Cryo-EM
Citations:	Items that this one cites
Online Access:	Get full text
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