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Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope

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Published in:Microscopy and microanalysis 2022-08, Vol.28 (S1), p.2340-2340
Main Authors: Gavalda-Diaz, Oriol, Conroy, Michele, Giuliani, Finn
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Conroy, Michele
Giuliani, Finn
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source Cambridge Journals Online
subjects Crack propagation
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Physical Sciences Symposia
Stress propagation
title Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope
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