Improving Data from Electron Backscatter Diffraction Experiments using Pattern Matching Techniques

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Bibliographic Details
Published in:Microscopy and microanalysis 2022-08, Vol.28 (S1), p.3182-3183
Main Authors: Trimby, Pat, Larsen, Kim, Hjelmstad, Michael, Winkelmann, Aimo, Mehnert, Klaus
Format: Article
Language:English
Subjects:
Cross-Cutting Symposia
Diffraction patterns
Electron backscatter diffraction
Pattern matching
Vendor Symposium
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927622011813