Automated Grain Segmentation for Crystal Orientation mapping in 4D Scanning Transmission Electron Microscopy

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Bibliographic Details
Published in:Microscopy and microanalysis 2022-08, Vol.28 (S1), p.434-436
Main Authors: Zeitler, Daniel, Nikbin, Ehsan, Kong, Jonathan, McLeod, Robert A., Miller, R. J. Dwayne, Newman, Roger C., Howe, Jane Y., Perovic, Doug
Format: Article
Language:English
Subjects:
Analytical Sciences Symposia
Automation
Crystal structure
Data collection
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Engineering
Mapping
Random access memory
Scanning transmission electron microscopy
Segmentation
Software
Transmission electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927622002434