Exchange-stiffness measurement scheme based on domain-wall chirality transition

Herein, we propose an experimental scheme to determine the strength of the Heisenberg exchange interaction in ultrathin magnetic films. In this scheme, the chirality transition between the Bloch- and Néel-type domain walls is analyzed under an in-plane magnetic field. Subsequently, the exchange stif...

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Bibliographic Details
Published in:Applied physics letters 2022-08, Vol.121 (7)
Main Authors: Nam, Yune-Seok, Kim, Dae-Yun, Park, Yong-Keun, Yu, Ji-Sung, Lee, Seong-Hyub, Kim, Duck-Ho, Min, Byoung-Chul, Choe, Sug-Bong
Format: Article
Language:English
Subjects:
Applied physics
Chirality
Domain walls
Exchanging
Kerr magnetooptical effect
Magnetic fields
Magnetic films
Sensitivity
Stiffness
Thick films
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Summary:Herein, we propose an experimental scheme to determine the strength of the Heisenberg exchange interaction in ultrathin magnetic films. In this scheme, the chirality transition between the Bloch- and Néel-type domain walls is analyzed under an in-plane magnetic field. Subsequently, the exchange stiffness constant is estimated based on the strength of the magnetic field for chirality transitions, as proposed by an analytical theory pertaining to chirality transitions, and confirmed based on micromagnetic prediction. Using the magneto-optical Kerr effect with high sensitivity on surface atomic layers, the present scheme is applicable to ultrathin magnetic films down to a few atomic layers, whose sensitivity is well below the lowest sensitivity limit of conventional measurement schemes. Hence, the present scheme is useful for extending the experimental range to investigate the exchange stiffness of few-atomic-layer-thick magnetic films.
ISSN:0003-6951
1077-3118
DOI:10.1063/5.0096132