Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy

Emergent behavior at oxide interfaces has driven research in complex oxide films for the past 20 years. Interfaces have been engineered for applications in spintronics, topological quantum computing, and high-speed electronics with properties not observed in bulk materials. Advances in synthesis hav...

Full description

Saved in:
Bibliographic Details
Published in:Journal of materials research 2021-01, Vol.36 (1), p.26-51
Main Authors: Thapa, Suresh, Paudel, Rajendra, Blanchet, Miles D., Gemperline, Patrick T., Comes, Ryan B.
Format: Article
Language:English
Subjects:
Applied and Technical Physics
Biomaterials
Charge transfer
Chemistry and Materials Science
Inorganic Chemistry
Invited Feature Paper - Review
Material properties
Materials Engineering
Materials research
Materials Science
Nanotechnology
Oxide coatings
Photoelectrons
Quantum computing
Spectrum analysis
Spintronics
Synchrotrons
Synthesis
Valence band
X ray photoelectron spectroscopy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Emergent behavior at oxide interfaces has driven research in complex oxide films for the past 20 years. Interfaces have been engineered for applications in spintronics, topological quantum computing, and high-speed electronics with properties not observed in bulk materials. Advances in synthesis have made the growth of these interfaces possible, while X-ray photoelectron spectroscopy (XPS) studies have often explained the observed interfacial phenomena. This review discusses leading recent research, focusing on key results and the XPS studies that enabled them. We describe how the in situ integration of synthesis and spectroscopy improves the growth process and accelerates scientific discovery. Specific techniques include determination of interfacial intermixing, valence band alignment, and interfacial charge transfer. A recurring theme is the role that atmospheric exposure plays on material properties, which we highlight in several material systems. We demonstrate how synchrotron studies have answered questions that are impossible in lab-based systems and how to improve such experiments in the future.
ISSN:0884-2914
2044-5326
DOI:10.1557/s43578-020-00070-9