Loading…
Multi-photon interference phenomena
In this work I demonstrate the interference of three photons, a generalisation of the famous Hong Ou Mandel (HOM) interference. I show that three-photon interference is governed by four parameters and measure three-photon interference independent of two-photon interference. I demonstrate that even w...
Saved in:
Published in: | arXiv.org 2022-09 |
---|---|
Main Author: | |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | In this work I demonstrate the interference of three photons, a generalisation of the famous Hong Ou Mandel (HOM) interference. I show that three-photon interference is governed by four parameters and measure three-photon interference independent of two-photon interference. I demonstrate that even when the states of the photons are highly distinguishable they can still exhibit strong quantum interference, challenging our intuition formed by the double slit and HOM interference. This is followed by a demonstration of four-photon interference, where surprisingly we can still observe a "fringe" when the involved particles are pairwise orthogonal. To explain these effects, I present a new framework to describe multi-photon interference in terms of a graph-theoretical approach, which illustrates the origin of different orders of multi-photon interference. My work leads to a more general definition of what we regard as an interference fringe in multi-photon scattering. This study of multi-photon interference is followed by an interdisciplinary work between photonics and solid state physics in the newly developing field of topological photonics. I realise a simulation of the Jackiw-Rossi model as a localised topological mode in a photonic-crystal analogue of the 2D graphene lattice. I succeed in the experimental demonstration of a single such excitation and I am able to study the detailed mode structure for the first time. The mode is a result of a topological defect and is, as such, protected against errors that do not change the topology of the system. |
---|---|
ISSN: | 2331-8422 |