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Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature

In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test,...

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Published in:Journal of materials science. Materials in electronics 2022-09, Vol.33 (26), p.21127-21136
Main Authors: Ahn, Byeongjin, Kim, Jahyeon, Cheon, Gyeong-Yeong, Lee, Tae-Ik, Park, Young-Bae, Kim, Jungsoo, Ko, Yong-Ho
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container_issue 26
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container_title Journal of materials science. Materials in electronics
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creator Ahn, Byeongjin
Kim, Jahyeon
Cheon, Gyeong-Yeong
Lee, Tae-Ik
Park, Young-Bae
Kim, Jungsoo
Ko, Yong-Ho
description In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test, which was performed by the simultaneous application of an electrical current density of 4 × 10 4  A/cm 2 and an elevated temperature of 175 °C. During the complex stress test, we evaluated the changes in electrical resistance at the wire joints to define the joint properties and lifetime of the wire bonding joints, such as the formation of intermetallic compounds (IMCs) and voids, which were also analyzed using scanning electron microscopy, energy-dispersive spectrometry, and electron probe microanalysis. Under the complex stress test, the joint lifetime of Al wires bonded on the ENIG-finished substrates was approximately three times higher than that on the OSP-finished substrates. Furthermore, Al 2 Cu IMCs, voids, and cracks, which cause degradation of joints, were observed on the OSP-finished substrate after only 100 h in the complex stress test; conversely, no such defects were observed on ENIG-finished substrates up to approximately 300 h. Therefore, we suggest that ENIG finishing is superior to OSP finishing for Al wire bonding joints that are exposed to complex stress in environments with both electrical currents and elevated temperatures.
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subjects Aluminum
Bonded joints
Characterization and Evaluation of Materials
Chemistry and Materials Science
Circuit reliability
Copper
Electric currents
Electron probe microanalysis
Finishing
High temperature
Intermetallic compounds
Materials Science
Optical and Electronic Materials
Preservatives
Solderability
Substrates
Wire
title Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature
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