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Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature
In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test,...
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Published in: | Journal of materials science. Materials in electronics 2022-09, Vol.33 (26), p.21127-21136 |
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container_title | Journal of materials science. Materials in electronics |
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creator | Ahn, Byeongjin Kim, Jahyeon Cheon, Gyeong-Yeong Lee, Tae-Ik Park, Young-Bae Kim, Jungsoo Ko, Yong-Ho |
description | In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test, which was performed by the simultaneous application of an electrical current density of 4 × 10
4
A/cm
2
and an elevated temperature of 175 °C. During the complex stress test, we evaluated the changes in electrical resistance at the wire joints to define the joint properties and lifetime of the wire bonding joints, such as the formation of intermetallic compounds (IMCs) and voids, which were also analyzed using scanning electron microscopy, energy-dispersive spectrometry, and electron probe microanalysis. Under the complex stress test, the joint lifetime of Al wires bonded on the ENIG-finished substrates was approximately three times higher than that on the OSP-finished substrates. Furthermore, Al
2
Cu IMCs, voids, and cracks, which cause degradation of joints, were observed on the OSP-finished substrate after only 100 h in the complex stress test; conversely, no such defects were observed on ENIG-finished substrates up to approximately 300 h. Therefore, we suggest that ENIG finishing is superior to OSP finishing for Al wire bonding joints that are exposed to complex stress in environments with both electrical currents and elevated temperatures. |
doi_str_mv | 10.1007/s10854-022-08917-z |
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4
A/cm
2
and an elevated temperature of 175 °C. During the complex stress test, we evaluated the changes in electrical resistance at the wire joints to define the joint properties and lifetime of the wire bonding joints, such as the formation of intermetallic compounds (IMCs) and voids, which were also analyzed using scanning electron microscopy, energy-dispersive spectrometry, and electron probe microanalysis. Under the complex stress test, the joint lifetime of Al wires bonded on the ENIG-finished substrates was approximately three times higher than that on the OSP-finished substrates. Furthermore, Al
2
Cu IMCs, voids, and cracks, which cause degradation of joints, were observed on the OSP-finished substrate after only 100 h in the complex stress test; conversely, no such defects were observed on ENIG-finished substrates up to approximately 300 h. Therefore, we suggest that ENIG finishing is superior to OSP finishing for Al wire bonding joints that are exposed to complex stress in environments with both electrical currents and elevated temperatures.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-022-08917-z</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Aluminum ; Bonded joints ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Circuit reliability ; Copper ; Electric currents ; Electron probe microanalysis ; Finishing ; High temperature ; Intermetallic compounds ; Materials Science ; Optical and Electronic Materials ; Preservatives ; Solderability ; Substrates ; Wire</subject><ispartof>Journal of materials science. Materials in electronics, 2022-09, Vol.33 (26), p.21127-21136</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022. Springer Nature or its licensor holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-a838f5b4da2f9b44063156eef86de1401cf99a1d376b57569dfc788a0d1a7c573</cites><orcidid>0000-0002-1619-8467</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Ahn, Byeongjin</creatorcontrib><creatorcontrib>Kim, Jahyeon</creatorcontrib><creatorcontrib>Cheon, Gyeong-Yeong</creatorcontrib><creatorcontrib>Lee, Tae-Ik</creatorcontrib><creatorcontrib>Park, Young-Bae</creatorcontrib><creatorcontrib>Kim, Jungsoo</creatorcontrib><creatorcontrib>Ko, Yong-Ho</creatorcontrib><title>Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test, which was performed by the simultaneous application of an electrical current density of 4 × 10
4
A/cm
2
and an elevated temperature of 175 °C. During the complex stress test, we evaluated the changes in electrical resistance at the wire joints to define the joint properties and lifetime of the wire bonding joints, such as the formation of intermetallic compounds (IMCs) and voids, which were also analyzed using scanning electron microscopy, energy-dispersive spectrometry, and electron probe microanalysis. Under the complex stress test, the joint lifetime of Al wires bonded on the ENIG-finished substrates was approximately three times higher than that on the OSP-finished substrates. Furthermore, Al
2
Cu IMCs, voids, and cracks, which cause degradation of joints, were observed on the OSP-finished substrate after only 100 h in the complex stress test; conversely, no such defects were observed on ENIG-finished substrates up to approximately 300 h. Therefore, we suggest that ENIG finishing is superior to OSP finishing for Al wire bonding joints that are exposed to complex stress in environments with both electrical currents and elevated temperatures.</description><subject>Aluminum</subject><subject>Bonded joints</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Circuit reliability</subject><subject>Copper</subject><subject>Electric currents</subject><subject>Electron probe microanalysis</subject><subject>Finishing</subject><subject>High temperature</subject><subject>Intermetallic compounds</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Preservatives</subject><subject>Solderability</subject><subject>Substrates</subject><subject>Wire</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKAzEUhoMoWC8v4CrgOppkLsksS6k3RAUV3IVMcqIp00xNZqj6CD610QruhAMHfv4LfAgdMXrCKBWniVFZlYRyTqhsmCAfW2jCKlGQUvKnbTShTSVIWXG-i_ZSWlBK67KQE_R51fsw4Aid163v_PCOe4enHV77CLjtg_XhGfcB397fYR0snt9cnuM0RqcNEOeDTy9gs9CmIeoBEh6DhYhNv1x18IazCilhH-xosm_thxdsxhghj37XDbBcQQ6OEQ7QjtNdgsPfv48ez-YPswtyfXt-OZteE8MFHYiWhXRVW1rNXdOWJa0LVtUATtYWWEmZcU2jmS1E3VaiqhvrjJBSU8u0MBnJPjre9K5i_zpCGtSiH2PIk4oLVsia58suvnGZ2KcUwalV9Esd3xWj6pu52jBXmbn6Ya4-cqjYhFI2h2eIf9X_pL4AggKHcA</recordid><startdate>20220901</startdate><enddate>20220901</enddate><creator>Ahn, Byeongjin</creator><creator>Kim, Jahyeon</creator><creator>Cheon, Gyeong-Yeong</creator><creator>Lee, Tae-Ik</creator><creator>Park, Young-Bae</creator><creator>Kim, Jungsoo</creator><creator>Ko, Yong-Ho</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-1619-8467</orcidid></search><sort><creationdate>20220901</creationdate><title>Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature</title><author>Ahn, Byeongjin ; Kim, Jahyeon ; Cheon, Gyeong-Yeong ; Lee, Tae-Ik ; Park, Young-Bae ; Kim, Jungsoo ; Ko, Yong-Ho</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-a838f5b4da2f9b44063156eef86de1401cf99a1d376b57569dfc788a0d1a7c573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Aluminum</topic><topic>Bonded joints</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Circuit reliability</topic><topic>Copper</topic><topic>Electric currents</topic><topic>Electron probe microanalysis</topic><topic>Finishing</topic><topic>High temperature</topic><topic>Intermetallic compounds</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Preservatives</topic><topic>Solderability</topic><topic>Substrates</topic><topic>Wire</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ahn, Byeongjin</creatorcontrib><creatorcontrib>Kim, Jahyeon</creatorcontrib><creatorcontrib>Cheon, Gyeong-Yeong</creatorcontrib><creatorcontrib>Lee, Tae-Ik</creatorcontrib><creatorcontrib>Park, Young-Bae</creatorcontrib><creatorcontrib>Kim, Jungsoo</creatorcontrib><creatorcontrib>Ko, Yong-Ho</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials science collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ahn, Byeongjin</au><au>Kim, Jahyeon</au><au>Cheon, Gyeong-Yeong</au><au>Lee, Tae-Ik</au><au>Park, Young-Bae</au><au>Kim, Jungsoo</au><au>Ko, Yong-Ho</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2022-09-01</date><risdate>2022</risdate><volume>33</volume><issue>26</issue><spage>21127</spage><epage>21136</epage><pages>21127-21136</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>In this study, we investigated the joint reliability of Al wires bonded on an Al-based metal printed circuit board with Cu pads that are finished using two finishing processes, i.e., organic solderability preservative (OSP) and electroless nickel/immersion gold (ENIG), during a complex stress test, which was performed by the simultaneous application of an electrical current density of 4 × 10
4
A/cm
2
and an elevated temperature of 175 °C. During the complex stress test, we evaluated the changes in electrical resistance at the wire joints to define the joint properties and lifetime of the wire bonding joints, such as the formation of intermetallic compounds (IMCs) and voids, which were also analyzed using scanning electron microscopy, energy-dispersive spectrometry, and electron probe microanalysis. Under the complex stress test, the joint lifetime of Al wires bonded on the ENIG-finished substrates was approximately three times higher than that on the OSP-finished substrates. Furthermore, Al
2
Cu IMCs, voids, and cracks, which cause degradation of joints, were observed on the OSP-finished substrate after only 100 h in the complex stress test; conversely, no such defects were observed on ENIG-finished substrates up to approximately 300 h. Therefore, we suggest that ENIG finishing is superior to OSP finishing for Al wire bonding joints that are exposed to complex stress in environments with both electrical currents and elevated temperatures.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-022-08917-z</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-1619-8467</orcidid></addata></record> |
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subjects | Aluminum Bonded joints Characterization and Evaluation of Materials Chemistry and Materials Science Circuit reliability Copper Electric currents Electron probe microanalysis Finishing High temperature Intermetallic compounds Materials Science Optical and Electronic Materials Preservatives Solderability Substrates Wire |
title | Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature |
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