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Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

We study Multiple Andreev Reflections in long diffusive superconductor(S)-normal metal(N)-superconductor junctions with low-transparency interfaces. Assuming strong thermalization in the weak link we calculate the current-voltage dependence \(I(V)\). At intermediate temperatures, \(E_\mathrm{Th}\ll...

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Bibliographic Details
Published in:arXiv.org 2022-09
Main Authors: Polkin, A V, Ioselevich, P A
Format: Article
Language:English
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Summary:We study Multiple Andreev Reflections in long diffusive superconductor(S)-normal metal(N)-superconductor junctions with low-transparency interfaces. Assuming strong thermalization in the weak link we calculate the current-voltage dependence \(I(V)\). At intermediate temperatures, \(E_\mathrm{Th}\ll T\ll\Delta\), the current is dominated by noncoherent multiple Andreev reflections and is obtained analytically. The results are generalized to a ferromagnetic junction. We find that the exchange field produces a non-trivial splitting of the subharmonic gap structure. This effect relies on thermalization and vanishes in SFS junctions with no energy relaxation in the weak link.
ISSN:2331-8422