PoBO: A Polynomial Bounding Method for Chance-Constrained Yield-Aware Optimization of Photonic ICs

Conventional yield optimization algorithms try to maximize the success rate of a circuit under process variations. These methods often obtain a high yield but reach a design performance that is far from the optimal value. This article investigates an alternative yield-aware optimization for photonic...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2022-11, Vol.41 (11), p.4915-4926
Main Authors: He, Zichang, Zhang, Zheng
Format: Article
Language:English
Subjects:
Algorithms
Chance constrained programming
Circuit design
Constraints
Convexity
Design automation
Design optimization
Integrated circuit modeling
Integrated circuits
Measurement
Optimization
photonic design automation
Photonics
Polynomials
process variation
Safety critical
Uncertainty
uncertainty quantification
Yield estimation
yield-aware optimization
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Summary:Conventional yield optimization algorithms try to maximize the success rate of a circuit under process variations. These methods often obtain a high yield but reach a design performance that is far from the optimal value. This article investigates an alternative yield-aware optimization for photonic ICs: we will optimize the circuit design performance while ensuring a high yield requirement. This problem was recently formulated as a chance-constrained optimization, and the chance constraint was converted to a stronger constraint with statistical moments. Such a conversion reduces the feasible set and sometimes leads to an over-conservative design. To address this fundamental challenge, this article proposes a carefully designed polynomial function, called optimal polynomial kinship function, to bound the chance constraint more accurately. We modify existing kinship functions via relaxing the independence and convexity requirements, which fits our more general uncertainty modeling and tightens the bounding functions. The proposed method enables a global optimum search for the design variables via polynomial optimization. We validate this method with a synthetic function and two photonic IC design benchmarks, showing that our method can obtain better design performance while meeting a prespecified yield requirement. Many other advanced problems of yield-aware optimization and more general safety-critical design/control can be solved based on this work in the future.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2021.3137358