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Thermal EMF characterization of a built-up scanner for fully automatic multifunction calibrator: DC voltage measurement in SNSU BSN
In order to achieve fully automatic measurement of multifunction calibrator and digital multimeter using direct measurement method, SNSU BSN has built-up a low thermal scanner for switching automatically configuration between multifunction calibrator and digital multimeter terminal according to the...
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creator | Azzumar, Muhammad Syahadi, Mohamad Khairiyati, Lukluk Munir, Miftahul Sardjono, Hadi Faisal, Agah Perangin-angin, Windi Kurnia Chotimah, Ashri Khusnul Hapiddin, Asep Ratnaningsih, Ratnaningsih Boynawan, Ahmad Mohamad |
description | In order to achieve fully automatic measurement of multifunction calibrator and digital multimeter using direct measurement method, SNSU BSN has built-up a low thermal scanner for switching automatically configuration between multifunction calibrator and digital multimeter terminal according to the set parameter and measurement point. The usage of switching system in dc voltage measurement can cause voltage offset, such as from the thermal emf of a particular switch. The thermal emf of scanner has been characterized by differential measurement method, and the comparison of thermal emf between using and without scanner has also been carried out in order to get the true thermal emf of scanner. The results of characterization show that the different thermal emfs between scanner and without are 0.02 µV in 1 V and 1.80 µV in 10 V. By comparing to CMCs of SNSU BSN in both source and meter, the thermal emf of scanner gives less significant effect to the dc voltage measurement. |
doi_str_mv | 10.1063/5.0108855 |
format | conference_proceeding |
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The usage of switching system in dc voltage measurement can cause voltage offset, such as from the thermal emf of a particular switch. The thermal emf of scanner has been characterized by differential measurement method, and the comparison of thermal emf between using and without scanner has also been carried out in order to get the true thermal emf of scanner. The results of characterization show that the different thermal emfs between scanner and without are 0.02 µV in 1 V and 1.80 µV in 10 V. By comparing to CMCs of SNSU BSN in both source and meter, the thermal emf of scanner gives less significant effect to the dc voltage measurement.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/5.0108855</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Calibration ; Electrical measurement ; Measurement methods ; Multimeters ; Scanners ; Switching ; Thermodynamic properties ; Thermoelectricity</subject><ispartof>AIP conference proceedings, 2022, Vol.2664 (1)</ispartof><rights>Author(s)</rights><rights>2022 Author(s). 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The usage of switching system in dc voltage measurement can cause voltage offset, such as from the thermal emf of a particular switch. The thermal emf of scanner has been characterized by differential measurement method, and the comparison of thermal emf between using and without scanner has also been carried out in order to get the true thermal emf of scanner. The results of characterization show that the different thermal emfs between scanner and without are 0.02 µV in 1 V and 1.80 µV in 10 V. By comparing to CMCs of SNSU BSN in both source and meter, the thermal emf of scanner gives less significant effect to the dc voltage measurement.</description><subject>Calibration</subject><subject>Electrical measurement</subject><subject>Measurement methods</subject><subject>Multimeters</subject><subject>Scanners</subject><subject>Switching</subject><subject>Thermodynamic properties</subject><subject>Thermoelectricity</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2022</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kUFLw0AQhRdRsFYP_oMFb0LqbJNNNt60tirUemgL3sJks2tTkmzd7Bbq1T9ubAVvMgxz-d7M4w0hlwwGDOLwhg-AgRCcH5Ee45wFScziY9IDSKNgGIVvp-SsbdcAwzRJRI98LVbK1ljR8cuEyhValE7Z8hNdaRpqNEWa-7Jygd_QVmLTKEu16dpX1Y6id6buUElrX7lS-0budRKrMrfojL2lDyO6NZXDd0Vrha23qlaNo2VD57P5kt7PZ-fkRGPVqovf2SfLyXgxegqmr4_Po7tpIDvjPCiwSLuSMVOQglRKaqkjIUGKmKWAXKRCRSovcoFSo4IwFoCISaJEoSEP--TqsHdjzYdXrcvWxtumO5kNkzASkIqUd9T1gWpl6fYxZBtb1mh32dbYjGe_AWebQv8HM8h-PvInCL8B4t-ACg</recordid><startdate>20221110</startdate><enddate>20221110</enddate><creator>Azzumar, Muhammad</creator><creator>Syahadi, Mohamad</creator><creator>Khairiyati, Lukluk</creator><creator>Munir, Miftahul</creator><creator>Sardjono, Hadi</creator><creator>Faisal, Agah</creator><creator>Perangin-angin, Windi Kurnia</creator><creator>Chotimah, Ashri Khusnul</creator><creator>Hapiddin, Asep</creator><creator>Ratnaningsih, Ratnaningsih</creator><creator>Boynawan, Ahmad Mohamad</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20221110</creationdate><title>Thermal EMF characterization of a built-up scanner for fully automatic multifunction calibrator: DC voltage measurement in SNSU BSN</title><author>Azzumar, Muhammad ; Syahadi, Mohamad ; Khairiyati, Lukluk ; Munir, Miftahul ; Sardjono, Hadi ; Faisal, Agah ; Perangin-angin, Windi Kurnia ; Chotimah, Ashri Khusnul ; Hapiddin, Asep ; Ratnaningsih, Ratnaningsih ; Boynawan, Ahmad Mohamad</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2435-dad9d9dc61e090ceecfcf48c0c86190a5898e4ebdb8acfae03680aaa77e8df0b3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Calibration</topic><topic>Electrical measurement</topic><topic>Measurement methods</topic><topic>Multimeters</topic><topic>Scanners</topic><topic>Switching</topic><topic>Thermodynamic properties</topic><topic>Thermoelectricity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Azzumar, Muhammad</creatorcontrib><creatorcontrib>Syahadi, Mohamad</creatorcontrib><creatorcontrib>Khairiyati, Lukluk</creatorcontrib><creatorcontrib>Munir, Miftahul</creatorcontrib><creatorcontrib>Sardjono, Hadi</creatorcontrib><creatorcontrib>Faisal, Agah</creatorcontrib><creatorcontrib>Perangin-angin, Windi Kurnia</creatorcontrib><creatorcontrib>Chotimah, Ashri Khusnul</creatorcontrib><creatorcontrib>Hapiddin, Asep</creatorcontrib><creatorcontrib>Ratnaningsih, Ratnaningsih</creatorcontrib><creatorcontrib>Boynawan, Ahmad Mohamad</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Azzumar, Muhammad</au><au>Syahadi, Mohamad</au><au>Khairiyati, Lukluk</au><au>Munir, Miftahul</au><au>Sardjono, Hadi</au><au>Faisal, Agah</au><au>Perangin-angin, Windi Kurnia</au><au>Chotimah, Ashri Khusnul</au><au>Hapiddin, Asep</au><au>Ratnaningsih, Ratnaningsih</au><au>Boynawan, Ahmad Mohamad</au><au>Azzumar, Muhammad</au><au>Habibie, Muhammad Haekal</au><au>Darmayanti, Nur Tjahyo Eka</au><au>Aji, Daisman</au><au>Syahadi, Mohamad</au><au>Elishian, Christine</au><au>Azman, Novi</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Thermal EMF characterization of a built-up scanner for fully automatic multifunction calibrator: DC voltage measurement in SNSU BSN</atitle><btitle>AIP conference proceedings</btitle><date>2022-11-10</date><risdate>2022</risdate><volume>2664</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>In order to achieve fully automatic measurement of multifunction calibrator and digital multimeter using direct measurement method, SNSU BSN has built-up a low thermal scanner for switching automatically configuration between multifunction calibrator and digital multimeter terminal according to the set parameter and measurement point. The usage of switching system in dc voltage measurement can cause voltage offset, such as from the thermal emf of a particular switch. The thermal emf of scanner has been characterized by differential measurement method, and the comparison of thermal emf between using and without scanner has also been carried out in order to get the true thermal emf of scanner. The results of characterization show that the different thermal emfs between scanner and without are 0.02 µV in 1 V and 1.80 µV in 10 V. By comparing to CMCs of SNSU BSN in both source and meter, the thermal emf of scanner gives less significant effect to the dc voltage measurement.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0108855</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
subjects | Calibration Electrical measurement Measurement methods Multimeters Scanners Switching Thermodynamic properties Thermoelectricity |
title | Thermal EMF characterization of a built-up scanner for fully automatic multifunction calibrator: DC voltage measurement in SNSU BSN |
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