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Crystal growth and physico-chemical characterization of an organic 2-amino-6-methyl pyridinium L-tartrate single crystal for optoelectronic device applications
2-amino-6-methyl pyridinium L-tartrate (2A6MPLT) was used to grow a new organic nonlinear optical single crystal. The 2A6MPLT crystal grew in an orthorhombic space group P2 1 2 1 2 1 crystal structure. The crystal morphology was investigated. The percentage of transmittance and optical band gap of t...
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Published in: | Journal of materials science. Materials in electronics 2023-02, Vol.34 (4), p.245, Article 245 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | 2-amino-6-methyl pyridinium L-tartrate (2A6MPLT) was used to grow a new organic nonlinear optical single crystal. The 2A6MPLT crystal grew in an orthorhombic space group P2
1
2
1
2
1
crystal structure. The crystal morphology was investigated. The percentage of transmittance and optical band gap of the 2A6MPLT crystal were found to be 80% and 3.50 eV, respectively. The solid-state parameters of the grown crystals were examined. Surface laser damage threshold value of 2A6MPLT single crystals was measured to be 4.6 GW cm
−2
at 1064 nm laser radiation. The photoconductivity study confirms the grown crystal is positive photoconductivity. The microhardness test was carried out employing 2-amino-6-methyl pyridinium L-tartrate crystal, and therefrom the hardness number (H
v
), Meyer’s index (
n
), yield strength (σ
y
) and elastic stiffness constant (C
11
) were assessed. The dielectric behaviour of the grown crystal was studied for different temperatures at different frequencies. The 2A6MPLT had a SHG efficiency that was 1.42 times that of KDP and 0.312 times that of Urea. The Z-scan technique with an He–Ne laser at 632.8 nm was used to analyse the third order optical nonlinearity characteristics of 2A6MPLT and its suitability in NLO applications. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-022-09750-0 |