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Sensitive Detection of Doped Polymer Thin Films Using Terahertz Metamaterial Based on Analog of Electromagnetically Induced Transparency
We propose a novel terahertz metamaterial-based sensor for the sensitive detection of doped polymer thin films. The metamaterial constructed by periodic quasi-ring resonators can generate the analog of electromagnetically induced transparency (EIT) at the terahertz region and work in a wide range of...
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Published in: | IEEE sensors journal 2023-02, Vol.23 (4), p.1-1 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We propose a novel terahertz metamaterial-based sensor for the sensitive detection of doped polymer thin films. The metamaterial constructed by periodic quasi-ring resonators can generate the analog of electromagnetically induced transparency (EIT) at the terahertz region and work in a wide range of incident angles. The simulated results show that the frequency and magnitude of the EIT-like resonance can be respectively affected by the refractive index and dielectric loss of the analyte, which is further explained by coupled harmonic oscillator model. The theoretical sensitivity of the proposed sensor is calculated as 185 GHz/RIU (RIU, Refractive Index Unit), showing a good sensing capability. In experiments, the Dispersed Red 1 (DR1) doped PMMA thin films with a subwavelength thickness of 600 nm were covered on the metamaterial surface. The measured results show that the EIT-like resonance experiences frequency red-shift and magnitude attenuation as the doping concentration increases, indicating the addition of DR1 can lead to the increase of both refractive index and dielectric loss of the PMMA thin film. The proposed metamaterial-based sensor can successfully identify the dielectric change of extremely thin polymer films caused by doping, offering a novel way to achieve high-sensitivity thin-film sensing. |
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ISSN: | 1530-437X 1558-1748 |
DOI: | 10.1109/JSEN.2023.3234970 |