Loading…

TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction

CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with a soft magnetic composite free layer have been developed for magnetic sensor applications. Tunnel magnetoresistance (TMR) ratios in the sensor-type MTJs have reached a ceiling due to a trade-off between the TMR ratio and interlayer exchange...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2023-02, Vol.122 (7)
Main Authors: Nakano, Takafumi, Fujiwara, Kosuke, Kumagai, Seiji, Ando, Yasuo, Oogane, Mikihiko
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543
cites cdi_FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543
container_end_page
container_issue 7
container_start_page
container_title Applied physics letters
container_volume 122
creator Nakano, Takafumi
Fujiwara, Kosuke
Kumagai, Seiji
Ando, Yasuo
Oogane, Mikihiko
description CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with a soft magnetic composite free layer have been developed for magnetic sensor applications. Tunnel magnetoresistance (TMR) ratios in the sensor-type MTJs have reached a ceiling due to a trade-off between the TMR ratio and interlayer exchange coupling (IEC) depending on the spacer thickness of the composite free layer. In this study, we developed a paramagnetic amorphous TaFeB-alloy spacer to replace the conventional Ta spacer and solve this trade-off. The TaFeB film showed a wider thickness window for a sufficient IEC, resulting in IEC energy values of 0.18–0.19 erg/cm2 at a thickness of 1.0 nm. In addition, we confirmed that the TaFeB film had an ability to function as a boron sink comparable to that of pure Ta. These characteristics allowed us to thicken the TaFeB spacer up to 1.0 nm in the sensor-type MTJs and attain an enhanced TMR ratio of up to 234%, which is the highest compared with cases using the conventional Ta spacer reported to date. These findings demonstrate that TaFeB alloy is a promising material for breaking the ceiling of sensor-type MTJs and increasing sensitivity.
doi_str_mv 10.1063/5.0132866
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2776807501</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2776807501</sourcerecordid><originalsourceid>FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543</originalsourceid><addsrcrecordid>eNp9kEFLAzEQhYMoWKsH_0HAk8K2yWaTbI9arAqVXuo5ZLOTsqVN1iQr9N-7tcUeBE8zA997w3sI3VIyokSwMR8RyvJSiDM0oETKjFFanqMBIYRlYsLpJbqKcd2fPGdsgGCpZ_CEY6sNBGx9wNHbhLd65SA1Bhu_bX1sEmAbAPBG73qscXjqe9n4fbUY_2xZpSPUJ1nqnIMNXnfOpMa7a3Rh9SbCzXEO0cfseTl9zeaLl7fp4zwzbMJSJsHWRtiqtFUNVVHmQoqSyRxsxQugJdVgmKkrQzmlwhaaVKA1LVgNBWe8YEN0d_Btg__sICa19l1w_UuVy96LSN7XM0T3B8oEH2MAq9rQbHXYKUrUvkXF1bHFnn04sNE0Se-z_MJfPpxA1db2P_iv8zfCaYB9</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2776807501</pqid></control><display><type>article</type><title>TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>AIP_美国物理联合会现刊(与NSTL共建)</source><creator>Nakano, Takafumi ; Fujiwara, Kosuke ; Kumagai, Seiji ; Ando, Yasuo ; Oogane, Mikihiko</creator><creatorcontrib>Nakano, Takafumi ; Fujiwara, Kosuke ; Kumagai, Seiji ; Ando, Yasuo ; Oogane, Mikihiko</creatorcontrib><description>CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with a soft magnetic composite free layer have been developed for magnetic sensor applications. Tunnel magnetoresistance (TMR) ratios in the sensor-type MTJs have reached a ceiling due to a trade-off between the TMR ratio and interlayer exchange coupling (IEC) depending on the spacer thickness of the composite free layer. In this study, we developed a paramagnetic amorphous TaFeB-alloy spacer to replace the conventional Ta spacer and solve this trade-off. The TaFeB film showed a wider thickness window for a sufficient IEC, resulting in IEC energy values of 0.18–0.19 erg/cm2 at a thickness of 1.0 nm. In addition, we confirmed that the TaFeB film had an ability to function as a boron sink comparable to that of pure Ta. These characteristics allowed us to thicken the TaFeB spacer up to 1.0 nm in the sensor-type MTJs and attain an enhanced TMR ratio of up to 234%, which is the highest compared with cases using the conventional Ta spacer reported to date. These findings demonstrate that TaFeB alloy is a promising material for breaking the ceiling of sensor-type MTJs and increasing sensitivity.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0132866</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Amorphous alloys ; Applied physics ; Energy value ; Interlayers ; Magnesium oxide ; Magnetoresistivity ; Sensors ; Thickness ; Tradeoffs ; Tunnel junctions ; Tunnel magnetoresistance</subject><ispartof>Applied physics letters, 2023-02, Vol.122 (7)</ispartof><rights>Author(s)</rights><rights>2023 Author(s). Published under an exclusive license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543</citedby><cites>FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543</cites><orcidid>0000-0001-9472-3303 ; 0000-0003-3552-9628 ; 0000-0002-9451-0014 ; 0000-0001-8056-2051</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/5.0132866$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27924,27925,76383</link.rule.ids></links><search><creatorcontrib>Nakano, Takafumi</creatorcontrib><creatorcontrib>Fujiwara, Kosuke</creatorcontrib><creatorcontrib>Kumagai, Seiji</creatorcontrib><creatorcontrib>Ando, Yasuo</creatorcontrib><creatorcontrib>Oogane, Mikihiko</creatorcontrib><title>TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction</title><title>Applied physics letters</title><description>CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with a soft magnetic composite free layer have been developed for magnetic sensor applications. Tunnel magnetoresistance (TMR) ratios in the sensor-type MTJs have reached a ceiling due to a trade-off between the TMR ratio and interlayer exchange coupling (IEC) depending on the spacer thickness of the composite free layer. In this study, we developed a paramagnetic amorphous TaFeB-alloy spacer to replace the conventional Ta spacer and solve this trade-off. The TaFeB film showed a wider thickness window for a sufficient IEC, resulting in IEC energy values of 0.18–0.19 erg/cm2 at a thickness of 1.0 nm. In addition, we confirmed that the TaFeB film had an ability to function as a boron sink comparable to that of pure Ta. These characteristics allowed us to thicken the TaFeB spacer up to 1.0 nm in the sensor-type MTJs and attain an enhanced TMR ratio of up to 234%, which is the highest compared with cases using the conventional Ta spacer reported to date. These findings demonstrate that TaFeB alloy is a promising material for breaking the ceiling of sensor-type MTJs and increasing sensitivity.</description><subject>Amorphous alloys</subject><subject>Applied physics</subject><subject>Energy value</subject><subject>Interlayers</subject><subject>Magnesium oxide</subject><subject>Magnetoresistivity</subject><subject>Sensors</subject><subject>Thickness</subject><subject>Tradeoffs</subject><subject>Tunnel junctions</subject><subject>Tunnel magnetoresistance</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp9kEFLAzEQhYMoWKsH_0HAk8K2yWaTbI9arAqVXuo5ZLOTsqVN1iQr9N-7tcUeBE8zA997w3sI3VIyokSwMR8RyvJSiDM0oETKjFFanqMBIYRlYsLpJbqKcd2fPGdsgGCpZ_CEY6sNBGx9wNHbhLd65SA1Bhu_bX1sEmAbAPBG73qscXjqe9n4fbUY_2xZpSPUJ1nqnIMNXnfOpMa7a3Rh9SbCzXEO0cfseTl9zeaLl7fp4zwzbMJSJsHWRtiqtFUNVVHmQoqSyRxsxQugJdVgmKkrQzmlwhaaVKA1LVgNBWe8YEN0d_Btg__sICa19l1w_UuVy96LSN7XM0T3B8oEH2MAq9rQbHXYKUrUvkXF1bHFnn04sNE0Se-z_MJfPpxA1db2P_iv8zfCaYB9</recordid><startdate>20230213</startdate><enddate>20230213</enddate><creator>Nakano, Takafumi</creator><creator>Fujiwara, Kosuke</creator><creator>Kumagai, Seiji</creator><creator>Ando, Yasuo</creator><creator>Oogane, Mikihiko</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9472-3303</orcidid><orcidid>https://orcid.org/0000-0003-3552-9628</orcidid><orcidid>https://orcid.org/0000-0002-9451-0014</orcidid><orcidid>https://orcid.org/0000-0001-8056-2051</orcidid></search><sort><creationdate>20230213</creationdate><title>TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction</title><author>Nakano, Takafumi ; Fujiwara, Kosuke ; Kumagai, Seiji ; Ando, Yasuo ; Oogane, Mikihiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Amorphous alloys</topic><topic>Applied physics</topic><topic>Energy value</topic><topic>Interlayers</topic><topic>Magnesium oxide</topic><topic>Magnetoresistivity</topic><topic>Sensors</topic><topic>Thickness</topic><topic>Tradeoffs</topic><topic>Tunnel junctions</topic><topic>Tunnel magnetoresistance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nakano, Takafumi</creatorcontrib><creatorcontrib>Fujiwara, Kosuke</creatorcontrib><creatorcontrib>Kumagai, Seiji</creatorcontrib><creatorcontrib>Ando, Yasuo</creatorcontrib><creatorcontrib>Oogane, Mikihiko</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nakano, Takafumi</au><au>Fujiwara, Kosuke</au><au>Kumagai, Seiji</au><au>Ando, Yasuo</au><au>Oogane, Mikihiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction</atitle><jtitle>Applied physics letters</jtitle><date>2023-02-13</date><risdate>2023</risdate><volume>122</volume><issue>7</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with a soft magnetic composite free layer have been developed for magnetic sensor applications. Tunnel magnetoresistance (TMR) ratios in the sensor-type MTJs have reached a ceiling due to a trade-off between the TMR ratio and interlayer exchange coupling (IEC) depending on the spacer thickness of the composite free layer. In this study, we developed a paramagnetic amorphous TaFeB-alloy spacer to replace the conventional Ta spacer and solve this trade-off. The TaFeB film showed a wider thickness window for a sufficient IEC, resulting in IEC energy values of 0.18–0.19 erg/cm2 at a thickness of 1.0 nm. In addition, we confirmed that the TaFeB film had an ability to function as a boron sink comparable to that of pure Ta. These characteristics allowed us to thicken the TaFeB spacer up to 1.0 nm in the sensor-type MTJs and attain an enhanced TMR ratio of up to 234%, which is the highest compared with cases using the conventional Ta spacer reported to date. These findings demonstrate that TaFeB alloy is a promising material for breaking the ceiling of sensor-type MTJs and increasing sensitivity.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0132866</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0001-9472-3303</orcidid><orcidid>https://orcid.org/0000-0003-3552-9628</orcidid><orcidid>https://orcid.org/0000-0002-9451-0014</orcidid><orcidid>https://orcid.org/0000-0001-8056-2051</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 2023-02, Vol.122 (7)
issn 0003-6951
1077-3118
language eng
recordid cdi_proquest_journals_2776807501
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP_美国物理联合会现刊(与NSTL共建)
subjects Amorphous alloys
Applied physics
Energy value
Interlayers
Magnesium oxide
Magnetoresistivity
Sensors
Thickness
Tradeoffs
Tunnel junctions
Tunnel magnetoresistance
title TaFeB spacer for soft magnetic composite free layer in CoFeB/MgO/CoFeB-based magnetic tunnel junction
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T05%3A11%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=TaFeB%20spacer%20for%20soft%20magnetic%20composite%20free%20layer%20in%20CoFeB/MgO/CoFeB-based%20magnetic%20tunnel%20junction&rft.jtitle=Applied%20physics%20letters&rft.au=Nakano,%20Takafumi&rft.date=2023-02-13&rft.volume=122&rft.issue=7&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/5.0132866&rft_dat=%3Cproquest_cross%3E2776807501%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c393t-7efdc6fb8fbdeb4826768372efb54e181aec3cdbc15116f4a0beaa143de453543%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2776807501&rft_id=info:pmid/&rfr_iscdi=true