BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD

We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant fre...

Full description

Saved in:
Bibliographic Details
Published in:Electromagnetic waves (Cambridge, Mass.) Mass.), 2009, Vol.92, p.103-120
Main Authors: Li, En, Nie, Zai-Ping, Guo, Gaofeng, Zhang, Qishao, Li, Zhongping, He, Fengmei
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053
cites cdi_FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053
container_end_page 120
container_issue
container_start_page 103
container_title Electromagnetic waves (Cambridge, Mass.)
container_volume 92
creator Li, En
Nie, Zai-Ping
Guo, Gaofeng
Zhang, Qishao
Li, Zhongping
He, Fengmei
description We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant frequencies and unloaded quality factors of the multimode cavity with and without sample. Detailed design and fabrication of the circular cavity capable of working at temperatures up to 1500οC are discussed. The measurement theory and new calculation method of the radius and length of the cavity at different temperatures are presented. The hardware system was built to measure dielectric properties at wide frequency band from 7 to 18 GHz and over a temperature range from room temperature to 1500οC. Measurement results of the dielectric properties of quartz samples are given and show a good agreement with the reference values.
doi_str_mv 10.2528/PIER09030904
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2780745126</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2780745126</sourcerecordid><originalsourceid>FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053</originalsourceid><addsrcrecordid>eNpNkF9LwzAUxYMoOHRvfoCAr1bzp2mbxyzN1kC7jiRVfCpdbcGhbrYb4rc3Oh924XIv3MPvXA4ANxjdE0aSh5VWBnFEfYdnYIIZ40HCE3Z-sl-C6ThukC8WxhThCfiamVKkM7FMYaGErYwq1NJZWM5hqlWupDNawpUpV8o4rf4OefkU5KW1sBBOGS1yC4WDmV5k0KnCC4XzHAsrq5cLKLWRVS4MlOJRu2dv47IyvQYXffM2dtP_eQWquXIy8-CFliIPWv_ePojWIaU9wQxFjCMUNVHfYvQSMxxFiBMc8hjzcB12hHLUkpgnTR-3HGPC1rhBjF6B2yN3N2w_D924rzfbw_DhLWsSJygOGSaRV90dVe2wHceh6-vd8PreDN81RvVvuvVpuvQHF_hgFA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2780745126</pqid></control><display><type>article</type><title>BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD</title><source>Publicly Available Content Database</source><source>EZB Electronic Journals Library</source><creator>Li, En ; Nie, Zai-Ping ; Guo, Gaofeng ; Zhang, Qishao ; Li, Zhongping ; He, Fengmei</creator><creatorcontrib>Li, En ; Nie, Zai-Ping ; Guo, Gaofeng ; Zhang, Qishao ; Li, Zhongping ; He, Fengmei</creatorcontrib><description>We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant frequencies and unloaded quality factors of the multimode cavity with and without sample. Detailed design and fabrication of the circular cavity capable of working at temperatures up to 1500οC are discussed. The measurement theory and new calculation method of the radius and length of the cavity at different temperatures are presented. The hardware system was built to measure dielectric properties at wide frequency band from 7 to 18 GHz and over a temperature range from room temperature to 1500οC. Measurement results of the dielectric properties of quartz samples are given and show a good agreement with the reference values.</description><identifier>ISSN: 1559-8985</identifier><identifier>ISSN: 1070-4698</identifier><identifier>EISSN: 1559-8985</identifier><identifier>DOI: 10.2528/PIER09030904</identifier><language>eng</language><publisher>Cambridge: Electromagnetics Academy</publisher><ispartof>Electromagnetic waves (Cambridge, Mass.), 2009, Vol.92, p.103-120</ispartof><rights>2009. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the associated terms available at https://www.jpier.org/about/aims-scope.html</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053</citedby><cites>FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2780745126?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,4010,25731,27900,27901,27902,36989,44566</link.rule.ids></links><search><creatorcontrib>Li, En</creatorcontrib><creatorcontrib>Nie, Zai-Ping</creatorcontrib><creatorcontrib>Guo, Gaofeng</creatorcontrib><creatorcontrib>Zhang, Qishao</creatorcontrib><creatorcontrib>Li, Zhongping</creatorcontrib><creatorcontrib>He, Fengmei</creatorcontrib><title>BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD</title><title>Electromagnetic waves (Cambridge, Mass.)</title><description>We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant frequencies and unloaded quality factors of the multimode cavity with and without sample. Detailed design and fabrication of the circular cavity capable of working at temperatures up to 1500οC are discussed. The measurement theory and new calculation method of the radius and length of the cavity at different temperatures are presented. The hardware system was built to measure dielectric properties at wide frequency band from 7 to 18 GHz and over a temperature range from room temperature to 1500οC. Measurement results of the dielectric properties of quartz samples are given and show a good agreement with the reference values.</description><issn>1559-8985</issn><issn>1070-4698</issn><issn>1559-8985</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNpNkF9LwzAUxYMoOHRvfoCAr1bzp2mbxyzN1kC7jiRVfCpdbcGhbrYb4rc3Oh924XIv3MPvXA4ANxjdE0aSh5VWBnFEfYdnYIIZ40HCE3Z-sl-C6ThukC8WxhThCfiamVKkM7FMYaGErYwq1NJZWM5hqlWupDNawpUpV8o4rf4OefkU5KW1sBBOGS1yC4WDmV5k0KnCC4XzHAsrq5cLKLWRVS4MlOJRu2dv47IyvQYXffM2dtP_eQWquXIy8-CFliIPWv_ePojWIaU9wQxFjCMUNVHfYvQSMxxFiBMc8hjzcB12hHLUkpgnTR-3HGPC1rhBjF6B2yN3N2w_D924rzfbw_DhLWsSJygOGSaRV90dVe2wHceh6-vd8PreDN81RvVvuvVpuvQHF_hgFA</recordid><startdate>2009</startdate><enddate>2009</enddate><creator>Li, En</creator><creator>Nie, Zai-Ping</creator><creator>Guo, Gaofeng</creator><creator>Zhang, Qishao</creator><creator>Li, Zhongping</creator><creator>He, Fengmei</creator><general>Electromagnetics Academy</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>2009</creationdate><title>BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD</title><author>Li, En ; Nie, Zai-Ping ; Guo, Gaofeng ; Zhang, Qishao ; Li, Zhongping ; He, Fengmei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, En</creatorcontrib><creatorcontrib>Nie, Zai-Ping</creatorcontrib><creatorcontrib>Guo, Gaofeng</creatorcontrib><creatorcontrib>Zhang, Qishao</creatorcontrib><creatorcontrib>Li, Zhongping</creatorcontrib><creatorcontrib>He, Fengmei</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Electromagnetic waves (Cambridge, Mass.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, En</au><au>Nie, Zai-Ping</au><au>Guo, Gaofeng</au><au>Zhang, Qishao</au><au>Li, Zhongping</au><au>He, Fengmei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD</atitle><jtitle>Electromagnetic waves (Cambridge, Mass.)</jtitle><date>2009</date><risdate>2009</risdate><volume>92</volume><spage>103</spage><epage>120</epage><pages>103-120</pages><issn>1559-8985</issn><issn>1070-4698</issn><eissn>1559-8985</eissn><abstract>We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant frequencies and unloaded quality factors of the multimode cavity with and without sample. Detailed design and fabrication of the circular cavity capable of working at temperatures up to 1500οC are discussed. The measurement theory and new calculation method of the radius and length of the cavity at different temperatures are presented. The hardware system was built to measure dielectric properties at wide frequency band from 7 to 18 GHz and over a temperature range from room temperature to 1500οC. Measurement results of the dielectric properties of quartz samples are given and show a good agreement with the reference values.</abstract><cop>Cambridge</cop><pub>Electromagnetics Academy</pub><doi>10.2528/PIER09030904</doi><tpages>18</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1559-8985
ispartof Electromagnetic waves (Cambridge, Mass.), 2009, Vol.92, p.103-120
issn 1559-8985
1070-4698
1559-8985
language eng
recordid cdi_proquest_journals_2780745126
source Publicly Available Content Database; EZB Electronic Journals Library
title BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T11%3A34%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=BROADBAND%20MEASUREMENTS%20OF%20DIELECTRIC%20PROPERTIES%20OF%20LOW-LOSS%20MATERIALS%20AT%20HIGH%20TEMPERATURES%20USING%20CIRCULAR%20CAVITY%20METHOD&rft.jtitle=Electromagnetic%20waves%20(Cambridge,%20Mass.)&rft.au=Li,%20En&rft.date=2009&rft.volume=92&rft.spage=103&rft.epage=120&rft.pages=103-120&rft.issn=1559-8985&rft.eissn=1559-8985&rft_id=info:doi/10.2528/PIER09030904&rft_dat=%3Cproquest_cross%3E2780745126%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c301t-6b433f2150659006a6fc10d751660921497194b4e2390c2798af7c91125b1a053%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2780745126&rft_id=info:pmid/&rfr_iscdi=true