DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES

• Published in: Electromagnetic waves (Cambridge, Mass.) Mass.), 2007, Vol.75, p.239-252
• Main Author: Chung, Boon-Kuan
• Format: Article
• Language: English
• ISSN: 1559-8985; 1070-4698; 1559-8985
• DOI: 10.2528/PIER07052801

Apractical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. Asmall position offset of the dielectric sample will give rise to some errors in calculating the dielectric constant, especially when a thin sample is used. To circumvent this problem, a method to determine the dielectric constant by measuring the transmission coefficient of the thin slab placed in a waveguide has been developed. Slab position offset from the measurement reference plane has no effect on the measurement accuracy. An explicit expression for the dielectric constant is obtained in terms of the transmission coefficient by simplifying the exact solution for transmission through a thin dielectric slab. The method is verified with measurement on Teflon of 0.5-mm thickness. The measured dielectric constant of Teflon shows excellent agreement of both ε' and ε'' with published data. Subsequently, the dielectric constant of a vegetation leaf was measured.